Structure and electronic properties of Fe-Ti thin films

• Autorzy: Smardz K. , Smardz L.
• Języki publikacji: EN

Abstrakty

EN

Fe/Ti multilayers (MLs) prepared onto glass substrates using UHV RF/DC magnetron sputtering. Results showed a significant drop of the coercivity measured for the Fe/Ti MLs with decrease in Fe layer thickness - typically from Hc ~ 2.2 kA/m to Hc ~ 0.2 kA/m - observed at a critical Fe thickness dcrit ~ 2.3 nm. Structural studies showed that the deposition of the 0.18 nm - Fe / 0.22 nm - Ti ML at 285 K leads to the formation of an uniform amorphous Fe-Ti alloy thin film due to a strong interdiffusion during the growth process. On the other hand, in-situ annealing of this ML at 750 K for 2 h resulted in the creation of a nanocrystalline phase. Furthermore, in-situ XPS studies showed that the valence band of the nanocrystalline Fe-Ti alloy film is broader compared to that measured for the amorphous phase with the same average composition.

Słowa kluczowe

EN

magnetic multilayers; electronic structure

PL

magnetyczne warstwy wielokrotne; struktura elektronowa

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2006
• Tom: Vol. 24, No. 3
• Strony: 827--831
• Opis fizyczny: Bibliogr. 12 poz.

Twórcy

autor

Smardz K.

autor

Smardz L.

• Institute of Materials Science and Engineering, Poznań University of Technology, pl. M. Skłodowskiej-Curie 5, 60-965 Poznań,

Bibliografia

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