Accurate interference pattern analysis module of automatic measurement system

• Autorzy: Whang A. J. , Chung C.-K.
• Języki publikacji: EN

Abstrakty

EN

Profile measurement of surfaces is of vital importance in today’s industries, such as lens, wafer fabrication, microstructure. The phase-shifting interferometry (PSI) is very useful in optical measurement. The PSI has many advantages including noncontact measurement, high accuracy and high-speed of measurement. However, most of the PSI measurements are only suitable for certain measurement function and must match the specific algorithms. Therefore we can not integrate the system effectively. In this paper, we choose an interference fringe analysis program, named Intelliwave that can support an automation measurement system. The system can also be integrated with interferometers for different application mechanics, including Michelson, moiré, ESPI, Twyman–Green, Fizeau and shearing interferometers.

Słowa kluczowe

EN

automatic measurement system; interferometry; integrate with interferometers; error-compensating algorithms

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2003
• Tom: Vol. 33, nr 4
• Strony: 627--634
• Opis fizyczny: Bibliogr. 11 poz., rys., tab.

Twórcy

autor

Whang A. J.

• Nation Taiwan University of Science and Technology, NO. 43, Sec. 4, Keelung Rd., Taipei, 106, Taiwan, R.o.c

autor

Chung C.-K.

• Nation Taiwan University of Science and Technology, NO. 43, Sec. 4, Keelung Rd., Taipei, 106, Taiwan, R.o.c

Bibliografia

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