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Small doses γ-irradiation effect on the photoluminescence properties of porous glasses

Wybrane pełne teksty z tego czasopisma
Identyfikatory
Warianty tytułu
Konferencja
6th Seminar Porous Glasses-Special Glasses, PGL 2002, Szklarska Poręba, 22-26.IX.2002 r.
Języki publikacji
EN
Abstrakty
EN
The g-irradiation effect on the photoluminescence of various types of porous silica glasses and on its change during a half-year storage has been studied. It has been revealed that the photoluminescence intensity of glasses with fine matrix and almost complete absence of silica gel does not change when irradiated at applied doses, but a long-wave shift of its maximum position is observed. The increase in photoluminescence intensity appeared to be the most stable in glasses with the thick-wall matrix. The model which explains apparent changes in photo-luminescent properties and also allows us to draw conclusions about some features of various types of porous silicate glasses structure has been presented.
Czasopismo
Rocznik
Strony
55--65
Opis fizyczny
Bibliogr. 12 poz., rys.
Twórcy
autor
  • Odessa National University, Dvoryanskaya 2, 65026 Odessa, Ukraine
  • Odessa National University, Dvoryanskaya 2, 65026 Odessa, Ukraine
  • Odessa National University, Dvoryanskaya 2, 65026 Odessa, Ukraine
  • Odessa National University, Dvoryanskaya 2, 65026 Odessa, Ukraine
  • Institute of Physics, Wrocław University o f Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
Bibliografia
  • [1] Astrova E.V., Vitman R.F., Emtsev V.V., Lebedev A.A., Poloskin D.S., Remenyuk A.D., Rud Yu.V., Fiz. Tekh. Poluprovodn. 30 (1996), 506 (in Russian).
  • [2] Lebedev A.A., Ivanov A.M., Remenuk A.D., Rud Yu.V., Fiz. Tekh. Poluprovodn. 30 (1996), 188 (in Russian).
  • [3] Vorobieva V.A., Gevelyuk S.A., Doycho I.K., Kovalenko N.P., Lishchuk D.E., Mak V.T., Prokopovich L.P., Fotoelektronika 9 (2000), 25 (in Russian).
  • [4] Gevelyuk S.A, Doycho I.K., Kovalenko M.P., Lishchuk D .E ., Mak V.T., Prokopovich L.P., Chistyakov V.P., Photoelectronics 10 (2001), 91.
  • [5] Gevelyuk S.A., Doycho I.K., Prokopovich L.P., Rysiakiewicz-Pasek E., Marczuk K., Ceramics 57 (1998), (Polish Ceramic Bull. 19, p. 59).
  • [6] Gevelyuk S.A., Doycho I.K., Kovalenko M.P., Safronsky E.D., Rysiakiewicz-Pasek E., Roizin Y.O., Opt. Appl. 30 (2000), 635.
  • [7] Arcymovich L.A., Guiderfor Nuclear Physics, Moskva 1963, p. 45 (in Russian).
  • [8] Baran N.P., Bulak B.M., Dzumajev B.R., Korunskaya N.E., Poliskij G., Torchinskaya T.V., Khomenkova L.Yu ., Ukrain. Fiz. Zh. 49 (1999), 394 (in Russian).
  • [9] Zhuravlev K.S., Glinsky A.M., Kobitsky A.Yu., Appl. Phys. Lett. 73 (1998), 2962.
  • [10] Vavilov V.S., Kiekielidze N.P., Smirnov L.S., Influence o f Radiation on Semiconductors, [Ed.] Nauka, Moskva 1988, p.192, (in Russian).
  • [11] Gevelyuk S.A., Doycho I.K., Rysiakiewicz-Pasek E., Marczuk K., J. Porous Materials 7 (2000), 465.
  • [12] Burkat E.M ., Dobychin D .P., Fiz. Khim. Stekla 18 (1 992), 129 (in Russian).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPW1-0013-0115
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