Analysis of specimen composition with the complex method using the backscattered electrons

• Autorzy: Kaczmarek D. , Detka A.
• Języki publikacji: EN

Abstrakty

EN

For the investigation of different types of welds joined with electron beam the methods like the X-ray microanalysis or microscopic examination of cross-sections are usually employed. The work presents the improved method of specimen composition analysis with backscattered electron signal (BSE) in the scanning electron microscope (SEM). The method consists in: the application of the separation of information about composition and topography of examined specimens by introducing a correction term into the algorithm of COMPO mode creation, the linearization of backscattering coefficient characteristics versus an atomic number and application of colour simulation. The verification of obtained results has been done on the example of W-Mo weld by typical methods employed in metallography.

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2002
• Tom: Vol. 32, nr 4
• Strony: 859--867
• Opis fizyczny: bibliogr. 28 poz.

Twórcy

autor

Kaczmarek D.

autor

Detka A.

• The Faculty of Microsystems Electronics and Photonic, Wrocław University of Technology, ul. Janiszewskiego 11/17, 50-372 Wrocław