Electron microscopic analysis of the structure of the silver halide light-sensitive layers.

• Autorzy: Drobnik A. , Nowak P.
• Języki publikacji: EN

Abstrakty

EN

In the paper, the results of morphology examination of silver halide light sensitive systems performed for 28 multilayer light sensitive materials, classified into three groups according to their properties, are presented. Identification of component layers, estimation of their thickness as well as the conclusions concerning both magnitude and external shapes of the sliver halide crystals contained in these layers were carried out based on computer analysis of the images of the transversal cross-section of the light-sensitive layer obtained in the electron microscope. The total thickness of the light-sensitive emulsion layer was determined using the method of intermediate (direct) measurement and the obtained results were presented in the graphic form as their relation to the nominal light sensitivity. As a result of the work carried out such characteristics of the morphology of contemporary silver halide materials were obtained which are not available in the form of experimental examination published in commercial catalogues, patents or the professional literature.

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2002
• Tom: Vol. 32, nr 1-2
• Strony: 93--101
• Opis fizyczny: bibliogr. 8 poz.

Twórcy

autor

Drobnik A.

autor

Nowak P.

• Institute of Physical and Theoretical Chemistry, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław