Reliability and low-frequency noise measurements of InGaAsP MQW buried-heterostructure lasers

• Autorzy: Pralgauskaite S. , Matukas J. , Palenskis V. , Šermukšnis E. , Vyšniauskas J. , Letal G. , Mallard R. , Smetona S.
• Języki publikacji: EN

Abstrakty

EN

A laser diode reliability test based on the measurements of the low-frequency optical and electrical noise, and their correlation factor changes during short-time ageing is presented. The noise characteristics reveal obvious differences between the stable and unreliable lasers operated near the threshold region. An excessive Lorentzian type noise with negative correlation factor at the threshold could be one of the criteria for identifying unreliable lasers. The behavior of unreliable lasers during ageing could be explained by migration of point recombination centres at the interface of an active layer, and by the formation of defect clusters.

Słowa kluczowe

EN

laser diode; low-frequency noise; optical noise; electrical noise; correlation factor; reliability

PL

dioda laserowa; szumy

• Wydawca: Instytut Łączności - Państwowy Instytut Badawczy
• Czasopismo: Journal of Telecommunications and Information Technology
• Rocznik: 2003
• Tom: nr 1
• Strony: 24--29
• Opis fizyczny: Bibliogr. 7 poz., rys.

Twórcy

autor

Pralgauskaite S.

• Semiconductor Physics Institute, Vilnius, Lithuania

autor

Matukas J.

• Department of Radiophysics Vilnius University Sauletekio 9 Vilnius, Lithuania

autor

Palenskis V.

• Department of Radiophysics Vilnius University Sauletekio 9 Vilnius, Lithuania

autor

Šermukšnis E.

• Department of Radiophysics Vilnius University Sauletekio 9 Vilnius, Lithuania

autor

Vyšniauskas J.

• Department of Radiophysics Vilnius University Sauletekio 9 Vilnius, Lithuania Gregory Letal

autor

Letal G.

• Bookham Technologies Ottawa, Ontario, Canada Robert Mallard

autor

Mallard R.

• Bookham Technologies Ottawa, Ontario, Canada

autor

Smetona S.

• Bookham Technologies Ottawa, Ontario, Canada

Bibliografia

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• [2] M. Fukuda and G. Iwane, “Degradation of active region in In-GaAsP/InP buried heterostructure lasers”, J. Appl. Phys., vol. 58, no. 8, pp. 2932–2936, 1985.
• [3] L. K. J. Vandamme, P. J. L. Herve, and R. Alabedra, “A decade of low frequency noise in optoelectronics and photonic component”, in Proc. 14th ICNF, Noise Phys. Syst. 1/f Fluct. Eds. C. Claeys and E. Simoen, Lauven, Belgium, 1997, pp. 495–502.
• [4] G. Hartler, U. Golze, and K. Paschke, “Extended noise analysis – a novel tool for reliability screening”, Microelectron. Reliab., vol. 38, pp. 1193–1198, 1998.
• [5] L. K. J. Vandamme, “Noise as a diagnostic tool for quality and reliability of electron devices”, IEEE Trans. Electron. Dev., vol. 41, no. 11, pp. 2176–2187, 1994.
• [6] G. Letal, S. Smetona, R. Mallard, J. Matukas, V. Palenskis, and S. Pralgauskait ̇e, “Reliability and low-frequency noise measurements of InGaAsP MQW buried-heterostructure lasers”, in Proc. 16th ICNF Noise Phys. Syst. 1/f Fluct., Ed. G. Bosman, New Jersey, 2001, pp. 743–746.
• [7] S. Pralgauskait ̇e, V. Palenskis, J. Matukas, ˇC. Pavasaris, E. Šermukš-nis, J. G. Simmons, R. Sobiestianskas, and S. Smetona, “Optical and electrical characteristics of DFB MQW laser diodes”, Mat. Sci., vol. 7, no. 2, pp. 80–86, 2001.