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Języki publikacji
Abstrakty
In this paper, we present a new approach for capacitance matrix calculation of lossy multilayer VLSI interconnects based on quasi-static analysis and Fourier projection technique. The formulation is independent from the position of the interconnect conductors and number of layers in the structure, and is especially adequate to model 2D and 3D layered structures with planar boundaries. Thanks to the quasi-static algorithms considered for the capacitance analysis and the expansions in terms of convergent Fourier series the tool is reliable and very efficient; results can be obtained with relatively little programming effort. The validity of the technique is verified by comparing its results with on-surface MEI method, moment method for total charges in the structure, and CAD-oriented equivalent-circuit methodology, respectively.
Słowa kluczowe
Rocznik
Tom
Strony
40--44
Opis fizyczny
Bibliogr. 9 poz., tab., rys.
Twórcy
autor
autor
autor
- Department of Electrical Engineering (ESAT), Division ESAT-TELEMIC, Katholieke Universiteit Leuven, Hasan.Ymeri@esat.kuleuven.ac.be
Bibliografia
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPS2-0018-0013