Whispering gallery resonator method for permittivity measurements

• Autorzy: Derzakowski K. , Abramowicz A. , Krupka J.
• Języki publikacji: EN

Abstrakty

EN

The new method of measuring permittivity is described. The measurements are performed using whispering gallery mode open dielectric resonators. The accuracy is assured by applications of the mode matching method. Three resonant modes (HE511, HE611 and HE711) are used in measurement procedure. Accuracy of the method is much better than 0.3% for the relative permittivity having values from 20 to 50.

Słowa kluczowe

EN

dielectric resonator; permittivity; loss tangent; measurement method; whispering gallery modes

• Wydawca: Instytut Łączności - Państwowy Instytut Badawczy
• Czasopismo: Journal of Telecommunications and Information Technology
• Rocznik: 2002
• Tom: nr 1
• Strony: 43--47
• Opis fizyczny: Bibliogr. 4 poz., tab., rys.

Twórcy

autor

Derzakowski K.

• Institute of Radioelectronics, Warsaw University of Technology

autor

Abramowicz A.

• Institute of Electronic Systems Warsaw University of Technology Nowowiejska st 15/19 00-665 Warsaw, Poland

autor

Krupka J.

• Institute of Microelectronics and Optoelectronics Warsaw University of Technology Nowowiejska st 15/19 00-665 Warsaw, Poland

Bibliografia

• [1] J. Krupka et al., “Complex permittivity measurements of extremely low loss dielectric materials using whispering gallery modes”, In IEEE MTT-S Int. Microw. Symp. Dig., Denver, USA, 1997, pp. 1347–1350.
• [2] Xiao Hu Jiao et al., “Whispering-gallery modes of dielectric structures: applications to millimeter-wave bandstop filters”, IEEE Trans. Microw. Theory Techn., vol. 35, pp. 1169–1175, 1987.
• [3] S. Maj and M. Pospieszalski, “A composite multilayered cylindrical dielectric resonator”, in IEEE MTT-S Int. Microw. Symp. Dig., San Francisco, USA, 1984, pp. 190–192.
• [4] K. Derzakowski and A. Abramowicz, “Dielectric resonator figure of merit”, Bull. Polish Acad. Sci., Techn. Sci., vol. 44, no. 2, pp. 129–139, 1996.