A method for evaluation of uncertainties of noise parameter measurement

• Autorzy: Schmidt-Szałowski M. , Wiatr W.
• Języki publikacji: EN

Abstrakty

EN

The assessment of uncertainties of a two-port noise parameters measurement, presented in the paper, relies on modeling of sources of errors and an investigation of propagation of the errors through a measurement system. This approach is based on a simplified additive error model and small-change sensitivity analysis. The evaluated uncertainties agrees with those observed in experiments. This method may be implemented in automatic noise measurement systems for on-line uncertainty assessment and for optimization of the design of an experiment.

Słowa kluczowe

EN

microwaves; noise metrology; measurement system; four noise parameters; sensitivity analysis; error propagation; uncertainty

• Wydawca: Instytut Łączności - Państwowy Instytut Badawczy
• Czasopismo: Journal of Telecommunications and Information Technology
• Rocznik: 2002
• Tom: nr 1
• Strony: 34--38
• Opis fizyczny: Bibliogr. 9 poz., tab., rys.

Twórcy

autor

Schmidt-Szałowski M.

• Institute of Electronic Systems, Warsaw University of Technology

autor

Wiatr W.

• Institute of Electronic Systems Warsaw University of Technology Nowowiejska st 15/19 00-665 Warsaw, Poland

Bibliografia

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• [2] R. Benelbar, B. Huyart, and R. G. Bosisio, “Microwave noise characterization of two-port devices using an uncalibrated tuner”, IEEE Trans. Microw. Theory Techn., vol. 44, no. 10, pp. 1725–1728, 1996.
• [3] S. Van den Bosch and L. Martens, “Improved impedance-pattern generation for automatic noise-parameter determination”, IEEE Trans. Microw. Theory Techn., vol. 46, no. 11, pp. 1673–1678, 1998.
• [4] A. C. Davidson, B. W. Leake, and E. W. Strid, “Accuracy improvements in microwave measurement of noise parameterss”, IEEE Trans. Microw. Theory Techn., vol. MTT-37, pp. 1973–1977, 1989.
• [5] G. Mamola and M. Sannino, “Errors in measurement of microwave transistor noise parameters”, Alta Freq., vol. XLII, no. 10, pp. 551–556, 1973.
• [6] M. Schmidt-Szałowski, “Experimental verification of measurement uncertainties of multi-state radiometer system”, in Conf. MIKON’96, Warsaw, Poland, 1996, pp. 331–335.
• [7] M. Schmidt-Szałowski and W. Wiatr, “An improved method for simultaneous small-signal and noise characterization of two-ports using multi-state radiometer”, in Conf. EuMC’99, Muenchen, Germany, 1999, pp. 61–64.
• [8] B. N. Taylor and C. E. Kuyatt, “Guidelines for evaluating and expressing the uncertainties of NIST measurement results”, NIST Techn. Note, no. 1297, 1994.
• [9] E. F. Vonesh and V. M. Chinchilli, Linear and Nonlinear Models for the Analysis of Repeated Measurements. New York, Basel, Hong Kong: Marcel Dekker, Inc. 1997.