Lowering the uncertainty in fast noise measurement procedures

• Autorzy: Acciari G. , Giannini F. , Limiti E. , Saggio G.
• Języki publikacji: EN

Abstrakty

EN

To completely characterise the noise behaviour of a two port device, four noise parameters F(min), R(n), G(opt) and B(opt) must be determined. This paper reports improvements in the uncertainty related to the above parameters, taking into account measurement errors due both to the limited instrument precision and connection repeatability. Results are reported for noise characterisation of 0.3 žm delta-doped HEMT devices by Alenia, demonstrating as the common hot-cold measurement procedure can result with an error confidence as low as 0.2% for all the noise parameters.

Słowa kluczowe

EN

noise; device characterisation; measurement errors; lowering uncertainty

• Wydawca: Instytut Łączności - Państwowy Instytut Badawczy
• Czasopismo: Journal of Telecommunications and Information Technology
• Rocznik: 2002
• Tom: nr 1
• Strony: 29--33
• Opis fizyczny: Bibliogr. 7 poz., rys.

Twórcy

autor

Acciari G.

• Department of Electronic Engineering, University of Rome "Tor Vergata"

autor

Giannini F.

• Department of Electronic Engineering University of Roma “Tor Vergata” Via del Politecnico 1 00133 Roma, Italy

autor

Limiti E.

• Department of Electronic Engineering University of Roma “Tor Vergata” Via del Politecnico 1 00133 Roma, Italy

autor

Saggio G.

• Department of Electronic Engineering University of Roma “Tor Vergata” Via del Politecnico 1 00133 Roma, Italy

Bibliografia

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• [4] J. M. O’Callaghan and J. P. Mondal, “A vector approach for noise parameter fitting and selection of source admittances”, IEEE Trans. Microw. Theory Techn., vol. MTT-39, no. 8, pp. 1376–1381, 1991.
• [5] M. Lahdes, “Uncertainty analysis of V-band on-wafer noise parameter measurement system”, in 28th Eur. Microw. Conf. Proc., Amsterdam, Netherlands, 1998, pp. 445–450.
• [6] M. Mitama and H. Katoh, “An improved computational method for noise parameter measurement”, IEEE Trans. Microw. Theory Techn., vol. MTT-27, no. 6, pp. 612–615, 1979.
• [7] A. Boudiaf and M. Laporte, “An accurate and repeatable technique for noise parameter measurements”, IEEE Trans. Instrum. Measur., vol. 42, no. 2, 1993