Precise measurement of complex permittivity of materials for telecommunications devices

• Autorzy: Nakamura T. , Nikawa Y.
• Języki publikacji: EN

Abstrakty

EN

In order to obtain precise complex permittivity of the dielectric materials obtained from the perturbation method a correction curve is made using the electromagnetic field simulator which applies transmission line modeling (TLM) method. In this experiment, generated microwave power with the frequency of 2.45 GHz is applied to heat dielectric material while measuring temperature dependence of complex permittivity of dielectric material. To obtain these objectives cavity resonator with cooling system is designed. It is found from the result that the accurate temperature dependence of complex permittivity of the materials can be obtained by the method presented here.

Słowa kluczowe

EN

perturbation method; TLM method; cavity resonator; simulation model; temperature dependence of complex permittivity; microwave measurement

• Wydawca: Instytut Łączności - Państwowy Instytut Badawczy
• Czasopismo: Journal of Telecommunications and Information Technology
• Rocznik: 2001
• Tom: nr 3
• Strony: 66--71
• Opis fizyczny: Bibliogr. 7 poz., rys.

Twórcy

autor

Nakamura T.

autor

Nikawa Y.

• Graduate School of Engineering, Kokushikan University, Japan,