Composition of Co films/Si substrate systems prepared by means of self-ion assisted deposition and accompanying silicon damage

• Autorzy: Tashlykov I. , Mikhalkovich Y. , Chernysh V.

Warianty tytułu

PL

Skład i uszkodzenia radiacyjne krzemu w strukturach warstwa Co – podłoże krzemowe wytwarzanych w warunkach dynamicznego mieszania jonowego

• Języki publikacji: EN

Abstrakty

EN

The composition, radiation damage and morphology of silicon modified by means of self – ion assisted Co deposition was investigated.

PL

Zbadano skład i uszkodzenia radiacyjne krzemu zmodyfikowanego podczas naniesienia powłok Co metodą dynamicznego mieszania jonowego.

Słowa kluczowe

EN

Co/Si structures; composition; damage; topography

PL

struktury Co/Si; skład; uszkodzenia; topografia

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Przegląd Elektrotechniczny
• Rocznik: 2010
• Tom: R. 86, nr 7
• Strony: 122--124
• Opis fizyczny: Bibliogr. 21 poz., rys., tab., wykr.

Twórcy

autor

Tashlykov I.

autor

Mikhalkovich Y.

autor

Chernysh V.

• Belarusian State Pedagogical University, Sovetskaja str. 18, 220050 Minsk

Bibliografia

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