Soft-fault diagnosis of dynamic circuits

• Autorzy: Tadeusiewicz M. , Kuczyński A.

Warianty tytułu

PL

Diagnostyka uszkodzeń w obwodach dynamicznych

• Języki publikacji: EN

Abstrakty

EN

The paper deals with soft-fault diagnosis of linear and nonlinear dynamic circuits with a single test point. The diagnosis includes identification of faulty elements from among a set of testable elements and determination their parameters. A simulation after-test method is developed, based on an appropriate diagnosis equation and measurements carried out on the test point at different points of time during the transient process. The transient and sensitivity analyses are carried out simultaneously leading to a set of sensitivity vectors. They are used to form a rectangular testability matrix included in a diagnostic equation which expresses the node voltage perturbations in terms of the parameter deviations. The number of rows of the testability matrix is larger than the number of columns. Usually, the diagnostic equation cannot be solved uniquely, because some columns of the testability matrix (and corresponding them parameters) form ambiguity groups and some sensitivity values are very small. To identify the testable elements the known method based on QR factorization of the testability matrix can be applied. Next a set of the potentially faulty elements is formed and the modified diagnostic equation is solved leading to the parameter deviations. The method is illustrated using two numerical examples.

PL

Praca przedstawia metodykę diagnostyki liniowych i nieliniowych obwodów dynamicznych przy zastosowaniu pojedynczego punktu pomiarowego w obwodzie. Diagnostyka pozwala na identyfikację uszkodzonego elementu jak również na określenie wartości parametru tego elementu. Metoda bazuje na pomiarach wartości chwilowych sygnału w różnych chwilach czasowych w stanie nieustalonym obwodu. Metoda zilustrowana jest dwoma przykładami numerycznymi.

Słowa kluczowe

EN

soft-fault diagnosis; dynamic circuits; transient state

PL

diagnostyka obwodów; obwody dynamiczne; stan nieustalony

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Przegląd Elektrotechniczny
• Rocznik: 2003
• Tom: R. 79, nr 10
• Strony: 750--753
• Opis fizyczny: Bibliogr. 12 poz., rys., wykr.

Twórcy

autor

Tadeusiewicz M.

• Technical University of Lodz, ul. Stefanowskiego 18/22, 90-924 Lodz, Poland

autor

Kuczyński A.

• Technical University of Lodz, ul. Stefanowskiego 18/22, 90-924 Lodz, Poland

Bibliografia

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