Scanner Application to Fully Automated Measurements in Electrical Impedance Tomography

• Autorzy: Filipowicz S. , Nita K. , Sikora R. , Sikora J.

Warianty tytułu

PL

Zastosowanie skanera w automatycznym systemie pomiarowym tomografii impedancyjnej

• Języki publikacji: EN

Abstrakty

EN

In this paper a fully automated system for tomographic investigations was presented. System consists of the Impedance Tomograph and 2D and 3D scanner. A detailed description of the system as well as some of the images for 2D space were provided. To produce the 2D images the Bell Functions algorithm was adopted. For 3D space a huge data base has been created and some examples were shown to prove that such a system is able to provide high quality measurements. Using this data base Artificial Neural Network will be trained to create a 3D images.

Słowa kluczowe

EN

impedance tomography; automatic control; image reconstruction

PL

tomografia impedancyjna; konstrukcja obrazu; sterowanie automatyczne

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Przegląd Elektrotechniczny
• Rocznik: 2003
• Tom: R. 79, nr 10
• Strony: 687--689
• Opis fizyczny: Bibliogr. 9 poz., ilustr., rys.

Twórcy

autor

Filipowicz S.

• Institute of the Theory of Electrical Engineering and Electrical Measurements, Warsaw University of Technology, ul. Koszykowa 75, 00-662 Warszawa, Poland

autor

Nita K.

• Institute of the Theory of Electrical Engineering and Electrical Measurements, Warsaw University of Technology, ul. Koszykowa 75, 00-662 Warszawa, Poland

autor

Sikora R.

• Institute of the Theory of Electrical Engineering and Electrical Measurements, Warsaw University of Technology, ul. Koszykowa 75, 00-662 Warszawa, Poland

autor

Sikora J.

• Theoretical Electrotechnics and Computer Science, Technical University of Szczecin, ul Wl. Sikorskiego 37, PL-70-313 Szczecin, Poland

Bibliografia

• [1] Instrukcja Obsługi Karty Sterownika Silników Krokowych SK300 OPTEL sp. Z o.o.
• [2] Instrukcja Obsługi Modułu Kontrolno Pomiarowego LC-011- 1612 AMBEX POLAND Sp. z o.o., Dokumentacja Drivera Modułu Kontrolno Pomiarowego LC-011-1612 AMBEX POLAND Sp.z o.o.
• [3] Nita K., Filipowicz S.F., Sikora J.: VEE Approach in Inpedance Tomography and Experimental Investigations, 25-th Seminar on Fundamentals of Electrotechnics and Circuit Theory, Gliwice-Ustroń, May 22-25, 2002, pp. 461-464
• [4] Nita K., Tarnowski P., Filipowicz S.F., Giza Z., Sikora J.: Resistance scanner. XXIV-nd International Conference on Fundamental of Electrotechnics and Circuit Theory, ICSPETO’01, Gliwice, May 2001, pp 523–527
• [5] Sikora R., Giza Z., Filipowicz S.F., Sikora J.: The Bell Function Approximation of Material Coefficients Distribution in the Electrical Impedance Tomography. COMPUMAG’99, Sapporo, Japan 26-29 Oct., pp. 300–301
• [6] Stasiak M., Filipowicz S.F., Sikora J.: Neural Network Approach to Inverse Problem solution in Impedance Tomography, 25-th Seminar on Fundamentals of Electrotechnics and Circuit Theory, Gliwice-Ustroń, May 22-25, 2002, pp. 21-24
• [7] Stasiak M., Nita K., Filipowicz S.F., Sikora J.: Eksperymentalny model tomografu impedancyjnego w przestrzeni 3D, III UPSS’01, 1-7 Sep. 2001, Ałuszta – Ukraina, pp. 158–161
• [8] Stasiak M., Sikora J., Filipowicz S.F.: Neural Network Approach to Inverse Problem Solution in Three-Dimensional Impedance Tomography, 2-nd International Symposium on Process Tomography in Poland 2002, Wroclaw 11th-12th Sep. pp. 125-129
• [9] L. Xuan, Z. Zeng, B. Shanker and L. Udpa: Development of a Meshless Finite Element Model for NDE Applications, Internal Report of Iowa State Univ. ([e-mail])