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Sterowniki bramkowe dla tranzystorów z węglika krzemu (SiC) - przegląd rozwiązań

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EN
Gate drive units for silicon carbide power transistors – solutions overview
Języki publikacji
PL
Abstrakty
PL
Artykuł przedstawia przegląd rozwiązań sterowników bramkowych tranzystorów mocy z węglika krzemu. Omówiono kolejno przypadki tranzystorów złączowych (JFET): normalnie załączonych a także normalnie wyłączonych oraz sterowniki prądu bazy dla tranzystorów bipolarnych (BJT). Przedstawiono także wyniki badań eksperymentalnych – przebiegi prądów i napięć zarejestrowane w trakcie testów dwupulsowych, obrazujące procesy łączeniowe dla każdego z omawianych tranzystorów.
EN
The paper presents an overview of the gate drive units for Silicon Carbide power transistors. Solutions for two types of Junction Field Effect Transistors: normally-on and normally-off as well as base drive units for bipolar transistors (BJTs) are described. Experimental results – waveforms of the currents and voltages recorded during double-pulse tests are presented in order to illustrate switching behavior of discussed transistors.
Rocznik
Strony
187--192
Opis fizyczny
Bibliogr. 70 poz., rys., tab.
Twórcy
autor
autor
Bibliografia
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Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPOB-0052-0034
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