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The article presents automatic films registration system for printed circuit board exposure units with a new proposed processing method, based on the Radon transformation. The conditions and criteria of alignment deviation evaluation for selected registration marks were defined. Proposition of a mechatronic unit built on a base images from to 2 or 4 movable cameras and 6-axis films positioning device is designed. Align film and panel for a solder mask targets images processing method, based on the Radon transformation, was used. Rules for 2- and 4-point films position optimization were created, as wells as marks and registration algorithms. Experimental results showing capability and limits of the registration system were presented.
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145--158
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Bibliogr. 9 poz., rys., tab.
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autor
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- University of Technology and Life Sciences Prof.Kaliski Av.7, 85-789 Bydgoszcz, adam.marchewka@utp.edu.pl
Bibliografia
- [1] Coombs, C. F., Jr., Printed Circuit Handbook 6th Edition, McGraw-Hill, 2007.
- [2] Gur, E., Weizman, Y., Zalevsky, Z., Radon transform based image enhancement for microelectronic chips inspection. IEEE Transactions on Device and Materials Reliability, 2010.
- [3] Holden, H., Calculate Your Fabrication Capability Coefficient, Happy Thoughts, CircuiTree, Feb 15, BNP, pp. 23.5, 2006.
- [4] Leavers, V. F., Boyce, J. F., The radon transform and its application to shape parametrization in machine vision. Image Vision Comput, 5:161--166, May 1987.
- [5] Marchewka, A., Zdrojewski, J., Film Alignment Before Solder Mask Exposure In: Choras R (ed.): Image Processing and Communications Challenges 3. Springer (accepted for printing), Heidelberg 2011.
- [6] Ohlig, B., Registration and Knowledge Through and Across Your Panel, CircuiTree, April 1, 2002.
- [7] Radon, J., On the determination of functions from their integrals along certain manifolds, in: The radon transform and some of its applications, annexe a. Wiley, New York, 1983, (translation of Radon's 1917 paper by R. Lohner), 1917.
- [8] Toft, P.: Detection of lines with wiggles using the radon transform, 1996.
- [9] Wocianiec, R., Zdrojewski, J., Film Position Optimization Before Exposure, Image Processing & Communication An International Journal, 5(2)35-46, 2010.
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Bibliografia
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bwmeta1.element.baztech-article-BPG8-0056-0039