Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy

• Autorzy: Neumann W. , Kirmse H. , Hausler I. , Mogilatenko A. , Zheng C. , Hetaba W.
• Języki publikacji: EN

Abstrakty

EN

Transmission electron microscopy (TEM) is a powerful diagnostic tool for the determination of structure/property relationships of materials. A comprehensive analysis of materials requires a combined use of a variety of complementary electron microscopical techniques of imaging, diffraction and spectroscopy at an atomic level of magnitude. The possibilities and limitations of quantitative TEM analysis will be demonstrated for interface studies of the following materials and materials systems: Nickel-based superalloy CMSX-10, (Zn,Cd)O/ZnO/Al2O3, (Al,Ga)N/AlN/Al2O3, GaN/LiAlO2 and FeCo-based nanocrystalline alloys.

Słowa kluczowe

EN

electron microscopy; energy dispersive X-ray spectroscopy; electron energy loss spectroscopy; electron holography

• Wydawca: Polska Akademia Nauk, Wydział IV Nauk Technicznych
• Czasopismo: Bulletin of the Polish Academy of Sciences. Technical Sciences
• Rocznik: 2010
• Tom: Vol. 58, nr 2
• Strony: 237--253
• Opis fizyczny: Bibliogr. 41 poz., rys.

Twórcy

autor

Neumann W.

autor

Kirmse H.

autor

Hausler I.

autor

Mogilatenko A.

autor

Zheng C.

autor

Hetaba W.

• Institute of Physics, Humboldt University of Berlin, Newtonstrasse 15, 12489 Berlin, Germany,

Bibliografia

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