Multiple soft fault diagnosis of nonlinear circuits using the fault dictionary approach

• Autorzy: Hałgas S.
• Języki publikacji: EN

Abstrakty

EN

The paper deals with a multiple fault diagnosis of DC transistor circuits with limited accessible terminals for measurements. An algorithm for identifying faulty elements and evaluating their parameters is proposed. The method belongs to the category of simulation before test methods. The dictionary is generated on the basis of the families of characteristics expressing voltages at test nodes in terms of circuit parameters. To build the fault dictionary the n-dimensional surfaces are approximated by means of section-wise piecewise-linear functions (SPLF). The faulty parameters are identified using the patterns stored in the fault dictionary, the measured voltages at the test nodes and simple computations. The approach is described in detail for a double and triple fault diagnosis. Two numerical examples illustrate the proposed method.

Słowa kluczowe

EN

fault diagnosis; fault dictionary; analog circuits; multiple faults

• Wydawca: Polska Akademia Nauk, Wydział IV Nauk Technicznych
• Czasopismo: Bulletin of the Polish Academy of Sciences. Technical Sciences
• Rocznik: 2008
• Tom: Vol. 56, nr 1
• Strony: 53--57
• Opis fizyczny: Bibliogr. 13 poz., rys.

Twórcy

autor

Hałgas S.

• Department of Electrical, Electronic Computer and Control Engineering, Technical University of L6dz, 18/22 Stefanowskiego St., 90-924 Łódź,

Bibliografia

• [1] W. Hochwald and I. D. Bastian, "A dc approach for analog fault dictionary determination", IEEE Trans. Cir. Syst. 26, 523-529 (1979).
• [2] T. Ozawa, Analog Methods for Computer - Aided Circuit Analysis and Diagnosis, M. Dekker, New York, 1988.
• [3] M. Worsman and M.W.T. Wong, "Non-linear analog circuit fault diagnosis with large change sensitivity", Int. J. Cir. Theor. Appl. 28, 281-303 (2000).
• [4] M. Tadeusiewicz, S. Hałgas, and M. Korzybski, "An algorithm for soft-fault diagnosis of linear and nonlinear circuits", IEEE Tran. Cir. Syst. 49, 1648-1653 (2002).
• [5] J. Rutkowski, Dictionary Approach to Fault Diagnosis in Analogue Circuits, WKL, Warszawa, 2003, (in Polish).
• [6] J.A. Starzyk, D. Liu, Z. Liu, D.E. Nelson, and J. Rutkowski, "Entropy-based optimum test points selection for analog fault dictionary techniques", IEEE Trans. Inst. Meas. 53, 754-761 (2004).
• [7] M. Tadeusiewicz, S. Hałgas, and P. Sidyk, "Building and exploiting fault dictionary for transistor circuits diagnosis", Proc. XIII Int. Symp. Theor. Electr. Eng., 388-391 (2005).
• [8] M. Tadeusiewicz and S. Hałgas, "An algorithm for multiple fault diagnosis in analogue circuits", Int. J. Cir. Theor. Appl. 34, 607-615 (2006).
• [9] N. Navid and A.N. Willson, "A theory and an algorithm for analog circuit fault diagnosis", IEEE Trans. Cir. Syst. 26, 440-457 (1979).
• [10] S. Hałgas, "Multiple soft fault diagnosis of nonlinear circuits using the fault dictionary approach", Proc. National Conf. Electronics 1, 119-124 (2007), (in Polish).
• [11] L.O. Chua and S.M. Kang, "Section-wise piecewise-linear functions: Canonical representation, properties, and applications", Proc. IEEE 65, 915-929 (1977).
• [12] T.L Quar1es, A.R. Newton, D.O. Pederson, and A. Sangiovanni-Vincentelli, SFICE-3 Version 3F5 User's Manual, Berkeley, California, 1994.
• [13] ICAP/4 - IsSpice 4 user's guide, Intusoft, 1998.