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Heuristic methods to test frequencies optimization for analogue circuits diagnosis

Wybrane pełne teksty z tego czasopisma
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Języki publikacji
EN
Abstrakty
EN
This paper presents methods for optimal test frequencies search with the use of heuristic approaches. It includes a short summary of the analogue circuits fault diagnosis and brief introductions to the soft computing techniques like evolutionary computation and the fuzzy set theory. The reduction of both, test time and signal complexity are the main goals of developed methods. At the before test stage, a heuristic engine is applied for the principal frequency search. The methods produce a frequency set which can be used in the SBT diagnosis procedure. At the after test stage, only a few frequencies can be assembled instead of full amplitude response characteristic. There are ambiguity sets provided to avoid a fault tolerance masking effect.
Rocznik
Strony
29--38
Opis fizyczny
Bibliogr. 20 poz., rys., tab.
Twórcy
autor
autor
autor
autor
  • Faculty of Automatic Control, Silesian University of Technology, 16 Akademicka St., 44-100 Gliwice, Poland, pjantos@polsl.pl
Bibliografia
  • [1] M. Catelaniand and A. Fort, "Soft fault detection and isolation in analog circuits: some results and a comparison between a fuzzy approach and radial basis function networks", IEEE Trans. on Instrumentation and Measurement 51(2), 196-202 (2002).
  • [2] L S. Milor, "A tutorial introduction to research on analog and mixed-signal circuit testing", IEEE Trans. Cir. Syst.-II, Analog Dig. Sig. Proces. 45(10), 1389-1407 (1998).
  • [3] Pen-Min Lin and Y.S. Elcherif, "Computational approaches to fault dictionary", in Analog Methods for Computer-Aided Circuit Analysis and Diagnosis, pp. 325-364, M. Dekker, New York, 1998.
  • [4] W. Hochwald and J.D. Bastian, "A DC dictionary approach for analog fault dictionary determination", IEEE Trans. Cir. Syst. 26, 523-529, (1979).
  • [5] C. Ferreira, Gene Expression Programming: Mathematical Modeling by an Artificial Intelligence, ISBN: 9729589054.
  • [6] C. Ferreira, "Gene expression programming: a new adaptive algorithm for solving problem", Complex Systems 13(2), 87-129 (2001).
  • [7] P. Jantos, D. Grzechca, T. Golonek, and J. Rutkowski, "Gene expression programming-based method of optimal frequency set determination for purpose of analogue circuits' diagnosis", V Int. Conf. on Computer Recognition Systems 2, CORES'07, 794-801 (2007).
  • [8] D.E. Goldberg, Genetic Algorithms in Search/Optimization and Machine Learning, Addison Wesley, London, 1989.
  • [9] Z. Michalewicz, Genetic Algorithms+Data Structures=Evolution Programs, Springer-Verlag, Berlin, 1996.
  • [10] T. Golonek and J. Rutkowski, "Genetic-algorithm-based method for optimal analog test points selection", IEEE Trans. Cir: Syst.-II. 54(2), 117-121 (2007).
  • [11] T. Golonek, D. Grzechca, and J. Rutkowski, "Evolutionary system for analog test frequencies selection with fuzzy initialization", IEEE Design and Diagnostics of Electronic Circuit and Systems DDECS I, 353-356 (2007).
  • [12] M.H. Mamdani, "Application of fuzzy logic to approximate reasoning using linguistic synthesis", IEEE Transaction on Computers C-26 (12) 1182-1191 (J977).
  • [13] LA. Zadeh, "Fuzzy sets", Information and Control 8, 338-353 (1965).
  • [14] L A. Zadeh, "A computational approach to fuzzy quantifiers in natural languages", Computers and Mathematics 9, 149-184 (1983).
  • [15] S. Kirkpatrick, C. D. Gelatt, and M. P. Vecchi, "Optimization by simulated annealing", Science 220, 671-680 (1983).
  • [16] L Ingber, "Simulated annealing: practice versus theory", Mathl. Comput. Modelling 18(11),.29-57 (1993).
  • [17] D. Grzechca and T. Golonek, "Simulated annealing with fuzzy fitness function for test frequencies selection", IEEE Conference on Fuzzy Systems, FUZZ-IEEE 2007 1, 438-443 (2007).
  • [18] P. Jantos, D. Grzechca, T. Golonek, and J. Rutkowski, "Optimal test frequencies choice with the use of Gene Expression Programming", VI State Conf. on Electronics 1, 143-148 (2007), (in Polish).
  • [19] T. Golonek, D. Grzechca, and J. Rutkowski, "Evolutionary method for analog test frequencies selection with fuzzy initialization", VI State Conf. on Electronics 1, 101-106 (2007), (in Polish).
  • [20] D. Grzechca, T. Golonek, and J. Rutkowski, "The use of simulated annealing to optimal excitation selection of analogue electronic circuits", VI State Conf. on Electronics 1, 83-88 (2007), (in Polish).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPG5-0031-0005
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