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Tracing temperature characteristics in diode-transistor circuits having multiple DC solutions

Wybrane pełne teksty z tego czasopisma
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The paper deals with circuits, composed of bipolar transistors, diodes, resistors and independent voltage sources, having multiple DC solutions. An algorithm for tracing temperature characteristics, expressing the output signal in terms of the chip temperature, is developed. It is based on the efficient method for finding all the DC solutions sketched in this paper. The algorithm gives complete characteristics which are multivalued and usually composed of disconnected branches. On the other hand the characteristics provided by SPICE are fragmentary, lose some branches or exhibit apparent hysteresis.
Rocznik
Strony
317--323
Opis fizyczny
Bibliogr. 15 poz., rys.
Twórcy
autor
  • Department of Electrical, Electronic, Computer and Control Engineering, Technical University of Lodz, 18/22 Stefanowskiego St., 90-924 Łódź, Poland, Michal.tadeusiewicz@p.lodz.pl
Bibliografia
  • [1] T. Nishi, "An efficient method to find all solutions of piecewise linear resistive circuits", Proc. ISCAS'89, 2052-2055 (1989).
  • [2] S. Pastore and A. Premoli, "Finding all DC solutions of nonlinear resistive circuits by exploring both polyhedral and rectangular circuits", IEEE Proc. Circuits, Devices and Systems 144 (9), 17-21 (1997).
  • [3] K. Yamamura and R. Kameko, "Finding all solutions of piecewise-linear circuits using simplex method", IEEE Trans. on Cir. and Syst.I 50 (1), 160-165 (2003).
  • [4] M. Tadeusiewicz and K. Głowienka, "A contraction algorithm for finding all the DC solutions of piece wise-linear circuits", J. Circuits, Systems and Computers 4, 319-336 (1994).
  • [5] L. Vandenberghe, B. L. Moor, and J. Vandewalle, "The generalized linear complementarity problem applied to the complete analysis of resistive piecewise-linear circuits", IEEE Trans. on Cir. and Syst. 36 (11), 1382-1391 (1989).
  • [6] M. Tadeusiewicz, "DC analysis of circuits with idealized diodes considering reverse bias breakdown phenomenon", IEEE Trans. on Cir. and Syst. 44 (4), 312-326 (1997).
  • [7] M. Tadeusiewicz and S. Hałgas, "An effective algorithm for finding all equilibrium states of circuits containing Gummel Poon modeled transistors", Proc. 6th Conf. Mixed Design of Integrated Circuits and Systems, 163-166 (1999).
  • [8] L. Kolev, "An interval method for global nonlinear analysis", IEEE Trans. on Cir. and Syst. 147 (5), 675-683 (2000).
  • [9] A. Reibiger, W. Mathis, T. Nahring, and L. Trajkovic, "Mathematical foundations of the TC-method for computing multiple DC-operating points", Int. J. Appl. Electromagnetics and Mech. 17, 169-191 (2003).
  • [10] L.E. Goldgeisser and M.M. Green, "A method for automatically finding multiple operating points in nonlinear circuits", IEEE Trans. on Cir. and Syst. I 52 (4) 776-784 (2005).
  • [11] K. Yamamura and N. Igarashi, "An interval algorithm for finding all solutions of non-linear resistive circuits", Int. J. Cir. Theor. Appl. 32, 47-55 (2004).
  • [12] I. W. Sandberg and A.N. Willson, "Some network-theoretic properties of nonlinear dc transistor networks", Bell Syst. Tech. J. 48, 1293-1311 (1969).
  • [13] T.L. Quarles, A.R. Newton, D.O. Pederson, and A. Sangiovanni-Vincentelli, SPICE-3 Version 3F5 User's Manual, Berkeley, CA: Dep. of EECS, California, 1994.
  • [14] M. Tadeusiewicz and S. Hałgas, "Determining of temperature characteristics in diode-transistor circuits with many equilibrium points", Materials of State Electronics Conference 1/2, 63-68 (2006), (in Polish).
  • [15] W Janke, Thermal Phenomena in Semiconductor Elements and Circuits, Warsaw, WNT, 1992, (in Polish).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPG5-0028-0008
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