Finding of optimal excitation signal for testing of analog electronic circuits

• Autorzy: Chruszczyk L. , Grzechca D. , Rutkowski J.
• Języki publikacji: EN

Abstrakty

EN

This article presents combined approach to analog electronic circuits testing by means of evolutionary methods (genetic algorithms) and using some aspects of information theory utilisation and wavelet transformation. Purpose is to find optimal excitation signal, which maximises probability of fault detection and location. This paper fo-cuses on most difficult case where very few (usually only input and output) nodes of integrated circuit under test are available.

Słowa kluczowe

EN

fault detection; fault location; dictionary fault diagnosis; analog electronic circuits; wavelet transform; genetic algorithm

• Wydawca: Polska Akademia Nauk, Wydział IV Nauk Technicznych
• Czasopismo: Bulletin of the Polish Academy of Sciences. Technical Sciences
• Rocznik: 2007
• Tom: Vol. 55, nr 3
• Strony: 273--280
• Opis fizyczny: Bibliogr. 5 poz., rys., tab.

Twórcy

autor

Chruszczyk L.

autor

Grzechca D.

autor

Rutkowski J.

• Faculty of Automatic Control, Electronics and Computer Science; Silesian Technical University 16 Akademicka St., 44-100 Gliwice, Poland,

Bibliografia

• [1] A. Balivada, J. Chen, and J.A. Abraham, "Analog testing with time response parameters", IEEE Design & Test of Computers, 18-25 (1996).
• [2] L Daubechies, "Ten lectures on wavelets", CBMS, SIAM 61, 194-202 (1994).
• [3] D. MacKay, Information Theory, Inference and Learning Algorithms, CUP, Cambridge, 2003.
• [4] Matlab v.7.2.0.232 (R2006a), Genetic Algorithm and Direct Search Toolbox v.2.0.1.
• [5] J. Rutkowski, Dictionary Diagnostic Methods, WKL, Warszawa, 2003, (in Polish)