Moving from micro- to nanoworld in optical domain scanning probe microscopy

• Autorzy: Radojewski J.
• Języki publikacji: EN

Abstrakty

EN

In the article we described the evolution of optical technology tram lens-type microscopes working in far-field to SNOM (Scanning Near-Field Optical Microscopy) constructions. We considered two systems elaborated in our laboratory, namely PSTM system (photon Scanning Tunelling Microscope) and SNOM system. In both systems we obtained subwavelength resolution. Same details about optical point probe technology in both systems are given and experimental results presented.

Słowa kluczowe

EN

optical microscopy; PSTM; SNOM; tip technology; piezoresistive cantilever

• Wydawca: Polska Akademia Nauk, Wydział IV Nauk Technicznych
• Czasopismo: Bulletin of the Polish Academy of Sciences. Technical Sciences
• Rocznik: 2006
• Tom: Vol. 54, nr 1
• Strony: 25--32
• Opis fizyczny: Bibliogr. 26 poz., 12 rys.

Twórcy

autor

Radojewski J.

• Faculty of Microsystem Electronics and Photonics, Wrocław University of Technology, 11/17 Janiszewskiego St., 50-372 Wrocław, Poland,

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