Tytuł artykułu
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Identyfikatory
Warianty tytułu
Języki publikacji
Abstrakty
Basic concepts of fault diagnosis in analog circuits and devices by means of the simulation-before test approach, the so called dictionary approach, have been presented. Special attention has been paid to application of artificial intelligence tools, such as: artificial neural networks, fuzzy sets and evolutionary computing
Słowa kluczowe
Rocznik
Tom
Strony
15--24
Opis fizyczny
Bibliogr. 48 poz., 2 rys., 1 tab.
Twórcy
autor
- Department of Electronics, Silesian University of Techology, Gliwice, Poland
- Department of Electronics, Silesian University of Technology, Gliwice, Poland
Bibliografia
- [AH02] C.Alippi, M.Catelani, A.Fort, M.Mugnaini, SST soft fault diagnosis in analog electonic circuits: a sensitivity-based approach by randomized algorithms, IEEE Trans. Instrumentation and Measurements, vol.51, No.5, Oct.02, pp. 1116-1125.
- [AmiOO] M.Aminian, F.Aminian, Neural-network based analog circuit fault diagnosis using wavelet transform aspreprocesor, IEEE Trans. CAS II, vol.47, Feb.2000, pp.151-156.
- [Ami02] F.Aminian, M.Aminian, H.W.Collins Jr., Analog fault diagnosis of actual circuits using neural networks, IEEE Trans I&M, vol.51, No.3, June 02, pp. 544-550.
- [Bak96] K.Baker, A.M.Richardson, A.P.Dorey, Mixed signal test-techniques, applications and demands, IEE Proc.- Circuits Devices Syst, vol.143, No.6. Dec. 1996, pp. 358-365.
- [Bal96] A.Balivada, J.Chen, J.A.Abraham, Analog testing with time response parameters, IEEE Design and Test of Computers, vol.13, No2, 1996, pp. 18-25.
- [Ban85] J.W. Bandler , A.E. Salama, Fault diagnosis of analog circuits, Proc. of the IEEE, vol. 73, Aug. 1985, pp. 1279-1325.
- [BurOl] M.Burns, G.W.Roberts, An introduction to mixed-signal 1C test and measurement, Oxford University Press, New York 2001.
- [Cat02] M.Catelani, A.Fort, Soft fault detection and isolation in analog circuits: comparison between a fuzzy approach and RBF networks, IEEE Trans. I&M, vol.51, Apr.2000, pp. 196-202.
- [Cat96] M.Catelani, M.Gori, On the application of neural network to fault diagnosis of electronic analog circuits, Measurement, vol.17, 1996, pp.73-80.
- [Col94] P.Collins, S.Yu, K.R.Eckersall, B.W.Jervis, I.M.Bell, G.E.Taylor, Application of Kohonen and supervised forced organisation maps to fault diagnosis in CMOS opamps, Electronic Letters, vol. 30, No 22, 1994, pp. 1846-47.
- [CzaOS] Z.Czaja, R.Zielonko, Fault diagnosis in electronic circuits based on bilinear transformation in 3-D and 4-D spaces, IEEE Trans. I&M, vol.52, No 1, Feb. 2003, pp.97-102.
- [Gol02a] T.GoIonek, J.Rutkowski, Optimum test point selection by means of genetic algorithm (in Polish), Proc. II KK Elektroniki, Kolobrzeg 2003, pp.246-252.
- [Gol02b]T.Golonek, J.Rutkowski, Use of evolution strategies to analog testing with time domain stimuli, Proc. Ill ICSES, Swieradow Zdrqj 2002, pp. 307-312.
- [Gol03] T.GoIonek, J.Rutkowski, Application of genetic programming to analog fault decoder design, Proc. ECCTD, Krakow 2003, vol.2, pp.113-116.
- [GrzOl] D.Grzechca, J.Rutkowski, Analog fault dictionary —fuzzy set approach, Proc. ECCTD, Helsinki 2001, pp. 249-252.
- [Grz02] D.Grzechca, J.Rutkowski, Use of neural network and fuzzy logic to time domain analog testing, Proc. Int. Conf. on Neural and Image Processing-ICONIP, Singapore 2002, pp.2601-2605.
- [Hoc79] W. Hochwald and J.Bastran, A DC approach for analog fault dictionary determination, IEEE Trans. CAS, vol.26, July 1979, pp'*523-529.
- [Hue93] J.L.Huertas, Test and design for testability of analog and mixed-signal 1C: theoretical basis and pragmatical approaches, Proc. ECCTD, Davos 1993, H.Dedieu ed., Elsevier, pp. 75-156.
- [Lee79] J.Lee, S.D.Bedrosian, Fault isolation algorithm for analog electronic systems using the fuzzy concept, IEEE Trans. CAS, vol.26, July 1979, pp. 518-522.
- [Lin88] P.M.Lin, Y.S.Elcherif, Computational approaches to fault dictionary, in Analog methods for computer-aided circuit analysis and diagnosis, T.Ozawa ed., M. Dekker, New York 1988, pp.325-364.
- [Mad99] K.Madani, A survey of artificial neural networks based fault detection and fault diagnosis techniques, Proc. IEEE Int. Joint Conf.on Neural Networks, Washington 1999, pp.3442-46.
- [Mai97] Y.Maidon, B.W.Jervis, N.Dutton, S. Lesage, Diagnosis of multifaults in analogue circuits using dictionary perceptrons, IEE Proc.-Part G, CDS, vol.144, No.3, 1997, pp.149-154.
- [Mat96] A.Materka, M.Strzelecki, Parametric testing of mixed-signal circuits by ANN processing of transient responses, Journal of Electronic Testing: Th. and Appl., No.9, 1996, pp. 187-202.
- [McK89]A.McKeon, A.Wakeling, Fault diagnosis in analogue circuits using Al techniques, Proc. Int. Test Conf., Washington DC 1989, pp.118-120.
- [Mea91] J.Meador, A.Wu, C.T.Tseng, T.S.Lin, Fast diagnosis if integrated circuit faults using feedforward neural networks, Proc. Int. Joint Conf. onN.N., Seattle 1991, pp.269-273.
- [MM89] L. Milor, V.Visvanathan, Detection of catastrophic faults in analog integrated circuits, IEEE Trans. Computer-Aided Design, vol.8, Feb. 1989, pp.114-130.
- [M1194] L.Milor, A.L.Sangiovanni-Vincentelli, Minimizing production test time to detect faults in analog circuits, IEEE Trans. CAD of Integrated CAS, vol.13, June 1994, pp. 796-813.
- [Mil98] L.S.Milor, A tutorial introduction to research on analog and mixed-signal circuit testing, IEEE Trans. On CAS, vol.45, No 10, Oct.1998, pp. 1389-1407.
- [Oso95] S.Osowski, J.Herault, P.Demartines, Fault location in analogue circuits using Kohonen neural nehvork, Bulletine Academic Polonaise, voj.43, No 1, 1995, pp. 125-133.
- [PraOO] V.C.Prasad, N.S.C.Babu, Selection of test nodes for analog fault diagnosis in dictionary approach, IEEE Trans. I&M, vol.49, No 6, Jun. 2000, pp. 1289-1297.
- [Puc04] B.Puchalski, L.Zielinski, J.Rutkowski, Application of genetic algorithms to optimum test point selection with the use of multiple input stimuli, Proc. IEEE ICSES, Poznan 2004, pp. 389-392.
- [Ric98] A.Richardson, A.Lechner, T.Olbrich, Design for testability strategies for mixed signal & analogue design -from layout to system, Proc. IEEE ICECS, Lisboa 1998, pp. 425-432.
- [Rut02] J.Rutkowski, B.Puchalski, Optimum test selection for analog circuits with the use of information channel concept, Proc. ICSES, Swieradow Zdrój 2002, pp. 325-330.
- [Rut03] J.Rutkowski, Fault dictionary approach to fault diagnosis in analog electronic circuits (in Polish), WKiL, Warszawa 2003.
- [Rut04] J.Rutkowski, L.Zielinski, B.Puchalski, Optimum test selection for analog circuits with the use of genetic algorithm, 8th On-line World Conference on Soft Computing in Industrial Applications, Springer 2005 (accepted for publication).
- [Rut90] J. Rutkowski, Use of neural networks to fault detection in analog circuits (in Polish), Proc. XIII KKTOiUE, Bielsko-Biata 1990, pp.343-347
- [Rut92] J. Rutkowski, A n.n. approach to fault location in nonlinear DC circuits, Proc. Int. Conf. ANN- ICANN, Brighton 1992, North-Holland, I.Alexander & J.Taylor ed., pp.1123-26.
- [Rut93] J. Rutkowski, A DC approach for analog fault dictionary determination, Proc. ECCTD, Davos 1993, Elsevier, H.Dedieu ed., pp.877-880.
- [Rut94] J. Rutkowski, A t\vo stage neural network DC fault dictionary, Proc. IEEE ISCAS, London 1994, pp.299-302.
- [Rut95] J. Rutkowski, The DC fault dictionary - neural network approach, Proc. ECCTD, Istanbul 1995,pp.295-298.
- [Sca89] F.Scalia, L.Marconi, et.al., An example of back propagation: diagnosis of dyspeptia, Proc. IEE Neural Network Conf., London 1989, pp.332-336.
- [Spi92] R.Spina, S.Upadhyaya, Fault diagnosis of analog circuits using ANN as signature analysers, Proc. 5th IEEE Int. ASIC Conf. And Exhibition, Buffalo 1992, pp.355-358.
- [Spi97] R.Spina, S.Upadhyaya, Linear circuit fault diagnosis using neuro-morphic analyzer, IEEE Trans. CAS II, vol.44, Mar.97, pp. 188-196.
- [Sta04] J.A.Starzyk, D.Liu, Z.H.Liu, J.Rutkowski, Entropy-based optimum test point selection for analog fault dictionary techniques, IEEE Trans. I&M, vol.53, No 3, June 2004, pp.754-761.
- [Ven89] V.Venkatasubramian, K.Chan, A neural network methodology for process fault diagnosis, AIChE Journal, vol.35, No 12, Dec. 1989, pp. 1993-2002.
- [YanOO] Z.R.Yang, M.Zwolinski, Applying a robust heteroscedastic probabilistic neural network to analog fault detection and classification, IEEE Trans. CAD IC&S, vol.19, Jan. 2000, pp.142-151.
- [Zad65] L.A.Zadeh, Fuzzy sets, Inf. Control, Aug. 1965, pp.338-353. [Zie96] R.Zielonko, Some theoretical foundations of analog signal shape design for measurement and testing, Measurement, vol.17, No 1, 1996, pp.29-37.
Uwagi
PL
Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę.
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Bibliografia
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