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Applying artificial intelligence techniques to analog fault detection and classification

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Języki publikacji
EN
Abstrakty
EN
Basic concepts of fault diagnosis in analog circuits and devices by means of the simulation-before test approach, the so called dictionary approach, have been presented. Special attention has been paid to application of artificial intelligence tools, such as: artificial neural networks, fuzzy sets and evolutionary computing
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autor
  • Department of Electronics, Silesian University of Techology, Gliwice, Poland
  • Department of Electronics, Silesian University of Technology, Gliwice, Poland
Bibliografia
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Uwagi
PL
Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPG4-0011-0083
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