On the non-exponential degradation kinetics in topologically-disordered substances

• Autorzy: Klym H. , Balitska V. , Shpotyuk O. , Vakiv M.
• Konferencja: XIth International Seminar on Physics and Chemistry of Solids (11 ; 2005 ; Polska)
• Języki publikacji: EN

Abstrakty

EN

The peculiarities of non-exponential degradation kinetics in topological-disordered solids are analyzed. It was shown that degradation transformations, described by ideal exponential function, are determined by one value of activation energy independently to the structural dispersivity of the system, while the non-exponential degradation kinetics corresponds to stretched or suppressed exponential-power-like relaxation function. The stretched degradation kinetics is proper to own degradation transformations in one-type systems. The degradation transformations, including two or more different elementary processes, are described by suppressed kinetics.

Słowa kluczowe

EN

non-exponential degradation kinetics; topological-disordered solids

• Wydawca: Wydawnictwo Uniwersytetu Humanistyczno-Przyrodniczego im. Jana Długosza w Częstochowie
• Czasopismo: Prace Naukowe. Chemia i Ochrona Środowiska / Akademia im. Jana Długosza w Częstochowie
• Rocznik: 2005
• Tom: Vol. 10
• Strony: 33--43
• Opis fizyczny: Bibliogr. 28 poz., fig., tab.

Twórcy

autor

Klym H.

• Lviv Scientific Research Institute of Materials of SRC "Carat" 202, Stryjska St., Lviv, Ukraine
• Lviv National Politechnic University 12, Bandera St., Lviv, UA-79013, Ukraine

autor

Balitska V.

• Lviv Scientific Research Institute of Materials of SRC "Carat" 202, Stryjska St., Lviv, Ukraine
• Instilute of Fire Safety, 35, Kleparivska str., Lviv, UA-79007, Ukraine

autor

Shpotyuk O.

• Lviv Scientific Research Institute of Materials of SRC "Carat" 202, Stryjska St., Lviv, Ukraine

autor

Vakiv M.

• Lviv Scientific Research Institute of Materials of SRC "Carat" 202, Stryjska St., Lviv, Ukraine

Bibliografia

• 1. Vakiv M.M., Balitska V.A., Shpotyuk O.I. Degradation transformations in topological disordered solid state: 1.The mathematical models of kinetics // Technology and design in electronics. - 2003. - No 4. - P. 61-64.
• 2. Balitska V., Shpotyuk O., Vakiv M. Degradation of dynamic radiation-induced effects in chalcogenide vitreous compounds // Inzyneria Materialowa. - 2001. - No 4. - P. 189-192.
• 3. Balitska V.O., Butkievich B., Shpotyuk O.I., Vakiv M.M. On the analytical description of ageing kinetics in ceramics manganite-based NTC thermistors // Microelectronics Reliability. - 2002. - Vol. 42. - P. 2002-2007.
• 4. Balitska V.O., Butkievich B., Vakiv M.M., Shpotyuk O.I. The relaxation of radiation induced absorption in chalcogenide semiconductors based on arsenic and germanium sulphide // Bull. Lviv Polytechnic National University. - 2000. - No 393. - P.144-152.
• 5. Balitska V.O., Shpotyuk O.I., Vakiv M.M. Degradation of electron-induced dichroism in glassy AS2STSb2S3 // Ukrainian Journal of Physical Optics. - 2000. - No 1. - P. 107-110.
• 6. Vakiv M.M. The simulation of degradation-optical properties of chalcogenide vitreous semiconductors // Technology and Designing in Electronic Equipment. - 2000. - No 5-6. - P. 52-57.
• 7. Hilfer R. Analytical representations for relaxation functions of glasses // J. Non-Cryst. Solids. - 2002. - Vol. 305. - P. 122-126.
• 8. Mazurin O.V. Relaxation phenomena in glass // J. Non-Cryst. Solids. - 1977. - Vol. 25. - P. 130-169.
• 9. Balitska V.O., Shpotyuk O.I., Vakiv M.M. Degradation of electron-induced dichroism in glassy As2-Sb2S3 // Ukr. J. Phys. Optics. - 2000. - No 2. - P. 107-110.
• 10. Felts A. Amorphous and vitreous inorganic solids. - M.: Mir, 1986.
• 11. Shpotyuk O.I., Balitska V.O. Electron-induced dichroism in vitreous As2S3: physical features and microstructural mechanism // Phys. Stat. Sol. - 1998. - Vol. 165. - P. 295-302.
• 12. Kovacs A.J., Hutchinson J.M., Aklonis J.J. lsobaric volume and enthalpy recovery of glasses. I. A critical survey of recent phenomenological approaches. - In: The structure of non-crystalline materials. - 1977. - London. - P. 167-172.
• 13. Corsaro R.D. Volume relaxation of dry and wet boron trioxide in the glass transformation range following a sudden change of pressure. - Phys. Chem. Glasses. - 1976. Vol. 17. - P. 13-22.
• 14. Williams G., Watts D.C. On-symmetrical dielectric relaxation behavior arising from a simple empirical decay function // Trans. Faraday Soc. - 1970. - Vol. 66. - P. 80-85.
• 15. De Bast J., Gilard P. Variation of the viscosity of glass and relaxation of stresses during stabilization II Phys. Chem. Glasses. - 1963. - Vol. 4, No 4. - P. 117-128.
• 16. Kohlrausch F. Uber die elastische nachwirkung bei der torsion. - Pogg. Ann. - 1863. - Bd. 119. - S. 337-368.
• 17. Gomez D., Alegria A On the empirical functions deseribing the α-relaxation of glass-forming systems. J. Non-Cryst. Sol. - 2001. - Vol. 287. - P. 246-251.
• 18. Emelianova E.V., Hertogen P., Arkhipov V.I., Adriaenssens G.I. A model of photoinduced anisotropy in chalcogenide glasses // J. Non-Cryst. Sol. - 2000. - Vol. 266-269. - P. 954-958.
• 19. Gusarov A.I., Dmytrjuk A.V., Kononov A.N., Mashkov A.A. Long-time kinetics of activation spectra of postradiation relaxation in glasses // Zh. Eksp. Teor. Fiziki - 1990. - V. 97. - P. 525-540.
• 20. Zaharov V. I. Olesk A.O. Materials and technology of NTC thick-film thermistors manutacturing // Elektronnaja Tehnika, Ser. Radiodetali i Komponenty. - 1989. - Vol. 65, No 3. - P. 30-34.
• 21. Zaharov V. I. Olesk A.O. Thick thermistors // Zarudeznaja Electronnaja Tehnika. - 1983. - No 5. - P. 43-47.
• 22. Zhong J., Bau H.H. Thick-film thermistors printed on LTCC tapes // American Ceramics Society Bulletin. - 2001. - Vol. 80, No 10. - P. 39-42.
• 23. Feingold A.H., Wahlers R.L., Amstutz P., Huang S.J. New microwave applications tor thick-film thermistors // Microwave Journal. - 2000. - No 1. - P. 90-98.
• 24. Vakiv M., Shpotyuk O., Mrooz O., Hadzaman I. Controlled thermistor effect in the system CuxNi1_x_yCo2yMn2_y/I0J4oumal of the European Ceramic Society. - 2001. - Vol. 21. - P. 1783-1785.
• 25. Vakiv M.M., Hadzaman I.V., Kovalskiy A.P., Kravtsiv M.M., Mrooz O.Y., Shpotyuk O.I., Thermoresistive material // Patent of Ukraine No 47534, H01C7/04, H01C7/13, C04B35/00 // C04B101:00, Prior.: 06.04.2000.
• 26. Plewa J., Altenburg H., Ochrymovych R., Shpotyuk O., Hadzaman I. New NTC electroceramics based on transition-metal manganites in thick-film performance. - Abstr. book of 8th Intem. Conf. on Electronic Ceramics and Their Application. 2002. - Rome, ltaly. - Aug. 25-28. - P. 154-155.
• 27. Klym H.I., Balitska V.O., Vakiv M.M., Brunets I.M., Shpotyuk O.I. Peculiarities of thermodegradation effect in thick films of mixed transition-metal oximanganites // Bull. Lviv Polytechnic National University. - 2004. - No 510: Solid-state electronics: theory, devices and application - P. 98-102.
• 28. Vakiv M.M., Shpotyuk O.I., Balitska V.O., Butkievich B., Shpotyuk L.I. Ageing behavior of electrical resistance in manganite NTC ceramics // J. Europ. Ceram. Soc. - 2004. - Vol. 24. - P. 1243-1246.