Tytuł artykułu
Autorzy
Wybrane pełne teksty z tego czasopisma
Identyfikatory
Warianty tytułu
Języki publikacji
Abstrakty
The deposition of stoichiometric TiO, films for V2O5/ TiO2 catalysts was investigated. DC magnetron sputtering from ceramic oxide targets in an argon/oxygen atmosphere was chosen as deposition technique. Ceramic TiO 2- x targets with a wide range of oxygen nonstoichiometry were prepared following a standard ceramic procedure starting from TiO, and Ti powders. The effect of oxygen nonstoichiometry on target behaviour upon sputtering was followed by means of the target voltage. Increase of voltage maximum with increasing nonstoichiometry of ceramic target was observed and discussed. Optical properties of layers prepared with different oxygen concentrations in the plasma were investigated.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Strony
30--43
Opis fizyczny
Bibliogr. 20 poz., wykr.
Twórcy
autor
- Instytut Technologii Materiałów Elektronicznych, Ul. Wólczyńska 133 01-919 Warszawa, tomasz_h@itme.edu.pl
Bibliografia
- [1] Ikezawa S., Mutsuga F., Kubota T., Suzuki R., Baba K., Koh S., Yoshioka Y., Nishiwaki , Kida K., Ninomiya Y. Wakita K.: Vacuum, 59 (2-3) (2000) 514-521
- [2] Nakamura M., Aoki T., Hatanaka: Vacuum: 59 (2-3) (2000) 506-513
- [3] Graetzel M.: Gommerns Inorg. Chem., 12 (1991) 93-102
- [4] Sabate J., Anderson M.A., Kikkawa H., Xu Q., Cervera-March S., Hill C.G. Jr: J. Catal., 134 (1992) 36-42
- [5] Fujii T., Sakata N., Taakada J., Miura Y., Daitoh Y., Takano M.: J.Mater.Res., 9 (1994) 1468-1473
- [6] Ben Amor S., Baud G., Besse J.P. Jacquet M.: Thin Solid Films, 293 (1997) 163-172
- [7] Okimura K., Shibata A., Maeda N., Tachibana K., Noguchi Y., Tsuchida K.: Jpn J.Appl.Phys. 34 (1995) 4950-4958
- [8] Aariic J., Aidla A.. Kiisler A., Uustare T., Sammelselg V.: Thin Solid Films, 305 (1997) 270-276
- [9] Yoon H.S., Kim S.K., Im H.S.: Biill.Korean Chem.Soc., 18 (6) (1997) 641-648
- [10] Zhang F., Wang X.. Li C., Wang H.. Chen L.. Liu V.: Surf.Coat.Technol. 49 (1998) 136-142
- [11] Martin P.J., Netterfield R.P.. Kinder V.: Swf. Coat. Technol., 49 (1991) 239-246
- [12] Netterfield V, Martin P.J., Sainty W.G., Duffy R.M., Pacey C.G.: Rev.Sci.lmtmm. 56 (1985) 1995-2001
- [13] Szczyrbowski J., Brauer G., Ruske M.. Teschner G., Zmelty A.: J. Non-Ciyst. Solids, 218 (1997) 262-266
- [14] Schiller S., Heisig U., Steinfelder K.. StrUmpfel J.: Thin Solid Films, 63 (1979)
- [I5] Tomaszewski H., Poelman H., Depla D., Poelman D., De Gryse R., Fiermans L., Reyniers M. F., Marin G.: Vacuum, 68 (2003) 31-38
- [16] Zeuner V, Neumann H. . Zalman J.. Biederman H.: J. Appl. Phys., 83 (1998) 5083
- [17] Aita K.: Critical Reviews in Solid Slate and Materials Science, 23 (1998) 205
- [18] Tucek J.C.. Walton S.G., Champion R.L: Phys. Rev. B, 53 (1996) 14127
- [19] Tachibana Y.. Ohsaki H., Hayashi A.. Mitsui A., Hayashi ¥.; Vacuum, 59 (2000) 836-843
- [20] Kester D.J., Messier R.:,/. Mater. Res. 8 (1993) 1928
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BPB2-0011-0011