Positron trapping in chalcogenide glasses: a comparison between arsenic sulphide and selenide.

• Autorzy: Shpotyuk O. I. , Filipecki J. , Kozdras A. , Popescu M. , Hyla M.
• Języki publikacji: EN

Abstrakty

EN

Positron annihilation lifetime measurements are performed for stoichiometric arsenic suphide. It is shown that two-state positron trapping model is valid for this glass as it has been shown previously for stoichiometric arsenic selenide. Two-component fitting parameters of LT computer program, describing positron annihilation in glassy As2S3, are close to those of glassy As2Se3. They are in good agreement with theoretically calculated distribution of nanovoid radii in these materials.

Słowa kluczowe

EN

positron; annihilation; lifetime; chalcogenide glasses; arsenic sulphide; arsenic selenide

PL

pozytron; anihilacja; czas życia; szkła chalkogenidkowe; siarczek arsenu; selenek arsenu

• Wydawca: Komitet Nauki o Materiałach PAN
• Czasopismo: Archives of Materials Science
• Rocznik: 2006
• Tom: Vol. 27, nr 4
• Strony: 167--175
• Opis fizyczny: Bibliogr. 23 poz., rys., tab.

Twórcy

autor

Shpotyuk O. I.

autor

Filipecki J.

autor

Kozdras A.

autor

Popescu M.

autor

Hyla M.

• Lviv Scientific Research Institute of Materials of Scientific Research Company "Carat", 202 Stryjska str., Lviv, 79031, Ukraine

Bibliografia

• [1] B. Bureau, X.H. Zhang, F. Smektala, J.-L. Adam, J. Troles, H. Ma, C. Boussard-Pledel, J. Lucas, P. Lucas, D. Le Coq, M.R. Riley, J.H. Simmons, J. Non-Cryst. Solids, 345&346, 276 (2004).
• [2] A. Feltz, Amorphe und Glasartige Anorganische Festkörper, Akademie-Verlag, Berlin 1983.
• [3] I. Chapnik, J. Mater. Sci. Lett., 12, 422 (1977).
• [4] Ya.A. Teteris, M.Ya. Reinfelde, Sov. Izv. AN SSSR. Neorgan. Mater., 22, 584(1986).
• [5] A. Kovalskiy, T. Kavetskyy, Ju. Plewa, O. Shpotyuk, Solid State Phenomena, 90-91, 241 (2003).
• [6] G. Saffarini, J.M. Saiter, Chalcogenide Letters, 3, 49 (2006).
• [7] O. Shpotyuk, J. Filipecki, Free volume in vitreous chalcogenide semiconductors: possibilities of positron annihilation lifetime study, Ed. WSP, Częstochowa 2003, 114 p.
• [8] M. Kastner, Phys. Rev. B, 7, 5237 (1973).
• [9] D.S. Sanditov, S.Sh. Sangadiev, Sov. Vysokomolekular. Veshchestva, 41, 1 (1999).
• [10] R. Zallen, The Physics of Amorphous Solids, John Wiley and.Sons Inc., 1983, 192 p.
• [11] S.A. Dembovsky, E.A. Chechetkina, Glass-formation, Nauka, Moscow 1990, 279 p.
• [12] R. Krause-Rehberg, H.S. Leipner, Positron annihilation in semiconductors. Defect studies, Springer-Verlag, Berlin-Heidelberg-New York 1999, p. 378.
• [13] J. Kansy, Instr. Meth. Phys. Res. A, 374, 235 (1996).
• [14] K.O. Jensen,Ph.S. Salmon, I.T. Penfold, P.G. Coleman, J. Non-Cryst. Solids, 170, 57 (1994).
• [15] LI. Bardyshev, V.I. Michailov et al., Solid State Physics, 15, 308 (1973).
• [16] O.K. Alekseeva, V.I. Mihailov et al., Sov. Fiz. Tverd. Tela, 19, 3452 (1977).
• [17] O.K. Alekseeva, V.I. Mihajlov et al., Phys. Stat. Sol., A48, K169 (1978).
• [18] O.K. Alekseeva, A.P. Chernov et al., Phys. Stat. Sol., A60, K185 (1980).
• [19] M.J. Puska, C. Corbel, R.M. Nieminen, Phys. Rev. B, 41, 9980 (1990).
• [20] J. Filipecki, Z. Mandecki et al., Visnyk Lviv. Univer. Ser. Phys., 33, 204 (2000).
• [21] A. Kozdras, J. Filipecki, M. Hyla, O. Shpotyuk, A. Kovalskiy, S. Szymura, J. Non-Cryst. Solids, 12-13, 1077 (2005).
• [22] O. Shpotyuk, A. Kovalskiy, J. Filipecki, M. Hyla, A. Kozdras, Physica B, 340-342, 960 (2003).
• [23] M.A. Popescu, J. Non-Cryst. Solids, 35-36, 549 (1980).