Relation between microstructure and grain boundary conductivity in yttria-doped zirconia.

• Autorzy: Rizea A. , Petot C. , Petot-Ervas G. , Kusinski J.

Warianty tytułu

PL

Zależność mikrostruktura-przewodność granic ziaren w tlenku cyrkonu z dodatkiem tlenku itru.

• Konferencja: XVIth Physical Metallurgy and Materials Science Conference on Advanced Materials and Technologies AMT'2001, Gdańsk-Jurata, 16-20 September 2001
• Języki publikacji: PL

Abstrakty

EN

The microstructure grain boundary relation in yttria-doped zirconia has been investigated on polycrystals sintered from powders prepared through two different processing routes. Samples with no evidence for continuous glassy boundary films show the highest grain boundary conductivities (sigma gb) which decrease in presence of alumina additions. On the contrary, samples with boundary glassy films show an increase of sigma gb for small alumina additions (< or = 2 mole%) do likely to a change in the glass phase composition. The same sigma gb activation energy found for the different samples suggests that only "clean" grain-boundaries contribute to the transport processes.

Słowa kluczowe

PL

mikrostruktura; granica ziarna; przewodność właściwa; tlenek cyrkonowy; tlenek itrowy; tlenek glinu; domieszka; polikryształ; korund; skład fazowy

EN

microstructure; grain boundary; conductivity; zirconia; yttria; alumina; dopant; polycrystals; phase composition

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Inżynieria Materiałowa
• Rocznik: 2001
• Tom: R. XXII, nr 5
• Strony: 784--786
• Opis fizyczny: Bibliogr. 9 poz., rys.

Twórcy

autor

Rizea A.

• Ecole Centrale Paris, France

autor

Petot C.

• Ecole Centrale Paris, France

autor

Petot-Ervas G.

• Ecole Centrale Paris, France

autor

Kusinski J.

• University of Mining and Metallurgy, Krakow, Poland

• Ecole Centrale Paris, France

Bibliografia

• [1] Rizea A, Petot C, Petot-Ervas G, Ageing of solid electrolytes and electrode materials in electrochemical devices, Ionics, 4 (1998) 336-346
• [2] Subarao E., An overwiew, Science and Technology of Zirconia, Advances in Ceramics, 3, (1981) 1-24
• [3] Filal M, Petot C, Mokchah M, Chateau C, Charpentier J.L, Ionic conductivity of yttrium-doped zirconia and the composite effect. Solid State Ionics, 80 (1995) 27-35
• [4] Badwai S.P.S., Banister M.J., Garret W.G., Low temperature behavior of zirconia oxygen sensors, Science and Technology of Zirconia, Edited by A.H. Heuer, L.W. Hobbs, The American Cer.Soc., Columbus, (1984) 598- 606
• [5] Petot-Ervas G., Rizea A., Petot C., Electrode materials, interface processes and transport properties of yttria-doped zirconia. Ionics 3 (1997) 405-411
• [6] Petot-Ervas G., Petot C., Experimental procedure for the determination of diffusion coefficients in ionic compounds – Application to YSZ, Solid State Ionics, 117 (1999), 27-39
• [7] Solmon H., Chaumont J., Dolin C., Monty C., Y and O self-diffusion in yttrium-doped zirconia, Cer.Transactions, The Amer.Cer.Soc. 24 (1992) 175- 182
• [8] Petot C., Filal M., Rizea A., Westmacott K.H., Laval J.Y., Lacour C., Microstructure and ionic conductivity of freeze-dried yttria-doped zirconia, J.Eur.Ccr.Soc.,18 (1998)1419-1428
• [9] Badwal S.P.S., Grain boundary resistivity in zirconia-based materials: Effect of sintering temperatures and impurities, Sol. St. Ionics, (1995) 67-80.