X-ray stress analysis of residual stress gradients in surface layers of steels.

• Autorzy: Ganev N. , Kraus I. , Gosmanova G. , Pfeiffer L. , Tietz H.D.
• Konferencja: XVIth Physical Metallurgy and Materials Science Conference on Advanced Materials and Technologies AMT'2001, Gdańsk-Jurata, 16-20 September, 2001
• Języki publikacji: PL

Abstrakty

EN

The aim of contribution is to present the theoretical possibilities of X-ray non destructive identification of stress gradients within the penetration depth of used radiation and its utilisation for experimental stress analysis. Practical usefulness of outlined speculations is illustrated with results of stress measurements on cut and shot-peened steel samples.

Słowa kluczowe

PL

nieniszcząca identyfikacja stopni naprężeń; promieniowanie rentgenowskie; naprężenia szczątkowe; pomiar; stal utwardzana powierzchniowo śrutem; warstwa wierzchnia

EN

non-destructive identification of stress gradients; X-radiation; residual stresses; measurement; shot-peened steel; surface layer

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Inżynieria Materiałowa
• Rocznik: 2001
• Tom: R. XXII, nr 4
• Strony: 323--325
• Opis fizyczny: Bibliogr. 3 poz., tab., rys.

Twórcy

autor

Ganev N.

• Czech Tcchnical University in Prague

autor

Kraus I.

• Czech Tcchnical University in Prague

autor

Gosmanova G.

• Czech Tcchnical University in Prague

autor

Pfeiffer L.

• Westsächsiche Hochschule, Zwickau, German

autor

Tietz H.D.

• Westsächsiche Hochschule, Zwickau, German

• Czech Technical University, Prague

Bibliografia

• [1] Kraus I.: X-ray Diffraction of non-uniform stress fields, Academia, Prague 1990.
• [2] Kraus I. and Ganev N.: Residual Stress and Stress Gradients, in: Industrial Applications of X-Ray Diffraction (Eds. D.K.Smith And F.Chung), Marcel Dekker, Inc., New York, 1999, pp. 793-811.
• [3] Kraus I. and Ganev N.: X-Ray Analysis of the Inhomogeneous Stress State, in: Defect And Microstructure Analysis by Diffraction (eds. R.Snyder, J.Fiala and H.- J.Bunge), Oxford University Press, 1999, pp. 367- 401.