Computer aided phase identification by electron diffraction pattern analysis.

• Autorzy: Gigla M. , Pączkowski P.
• Języki publikacji: EN

Abstrakty

EN

The computer program called EldyfWin and its application for phase identification from electron diffraction patterns is presented. This program is designed to deal with multi-phase diffraction patterns, especially those obtained from phases of low symmetry. Complex electron diffraction patterns can also be analyzed by computer simulation.

Słowa kluczowe

EN

phase identification; computer aided phase identification; electron diffraction pattern analysis; computer simulation

PL

identyfikacja fazy; identyfikacja fazy wspomagana komputerowo; analiza dyfraktogramu elektronowego; symulacja komputerowa

• Wydawca: Komitet Nauki o Materiałach PAN
• Czasopismo: Archives of Materials Science
• Rocznik: 2006
• Tom: Vol. 27, nr 1
• Strony: 49--61

Twórcy

autor

Gigla M.

autor

Pączkowski P.

• University of Silesia, Institute of Material Science, 40-007 Katowice, Bankowa 12, Poland

Bibliografia

• [1] P. Stadelmann, http://cimesg1.epfl.ch/CIOL/summary.html.
• [2] Wan Zheng-hua at all, Visual-computing in Electron Crystallography, Institute of physics, Chinese Academy of Science, Beijing 100080, China.
• [3] J. P. Mornirol i, Electron Crystallography, Proceedings of the NATO Advanced Study Institute on Electron Crystallography: Novel Approaches for Structure Determination of Nanosized Materials, Erice, Italy, 10-24 June 2004.
• [4] X. Zou, M. Sundberg, M. Lorine, S. Hovmöller, Ultramicroscopy, 62. 103 (1996).
• [5] J. Lábár, Ultramicroscopy, 103, 237 (2005).
• [6] D B. Williams, C. B. Carter, "Transmission Electron Microscopy", Plenum Press, New York 1996.