Analytical electron microscopy of interfacial segregation - a short review.

• Autorzy: Zięba P.
• Konferencja: XVth Physical Metallurgy and Materials Science Conference on Advanced Materials & Technologies AMT'98, 17-21 May 1998, Kraków-Krynica, Poland
• Języki publikacji: EN

Abstrakty

EN

The paper reviews the capabilities of the analytical electron microscopy for the study of the changes in the chemical composition which occur at grain boundaries. A strong emphasise was given for the deconvolution procedure necessary to obtain the most information from the elemental composition profiles.

Słowa kluczowe

EN

electron microscopy; interfacial segregation; grain; alloy

PL

mikroskopia elektronowa; segregacja międzyfazowa; ziarno; stop

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Inżynieria Materiałowa
• Rocznik: 1998
• Tom: R. XIX, nr 3
• Strony: 439--446
• Opis fizyczny: Bibliogr. 5 poz., rys.

Twórcy

autor

Zięba P.

• Institute of Metallurgy and Materials Science, Polish Academy of Sciences, Cracow, Poland

• Polish Academy of Sciences, Institute of Metallurgy and Materials Science, Kraków

Bibliografia

• [1] D.B. Willimas, J.R., Michael, J.I. Goldstein, and A.D. Romig, Jr. Ultramicroscopy, 47, (1992), 121
• [2] J.R. Michael and D.B. Williams, Metall. Trans. A, 15 (1984) 99.
• [3] M. Hellsing, Metall. Trans. A, 16 (1985) 686.
• [4] A.D. Romig, Jr., J.C. Lippold, and M.J. Cieslak, Metall. Trans. A, 19 (1988) 35.
• [5] F.C. Frank, Proc. Roy. Soc. A, 201 (1950) 586.