Metallurgical applications of electron back-scattering patterns.

• Autorzy: Hutchinson B. , Ryde L. , Lindh E.
• Konferencja: XV Physical Metallurgy and Materials Science Conference on Advanced Materials & Technologies, AMT'98, Kraków-Krynica 17-21May 1998, Poland
• Języki publikacji: EN

Abstrakty

EN

One of the most interesting developments in the area of quantitive metallography has been the possibility of obtaining diffraction patterns (electron back-scattering patterns or EBSPs) in the scanning electron microscope. The presentation gives a short description of the EBSP method and also the way in which it can be combined with automatic movement of the electron beam position to create an orientation imaging micrograph (OIM). Examples are then given of various applications of the EBSP/OIM method to practical problems relating to industrial metallic materials.

Słowa kluczowe

EN

diffraction patterns; metallography; electron microscopy; scanning electron microscope

PL

obraz dyfrakcyjny; metalografia; mikroskopia elektronowa; mikroskop elektronowy skaningowy

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Inżynieria Materiałowa
• Rocznik: 1998
• Tom: R. XIX, nr 3
• Strony: 124--129
• Opis fizyczny: Bibliogr. 14 poz., rys.

Twórcy

autor

Hutchinson B.

• Swedish Institute for Metals Research, Stockholm, Sweden

autor

Ryde L.

• Swedish Institute for Metals Research, Stockholm, Sweden

autor

Lindh E.

• Swedish Institute for Metals Research, Stockholm, Sweden

• Swedish Institute for Metals Research, Stockholm

Bibliografia

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• [13] S. Zajac, Swedish Inst. For Metals Research, Unpublished.
• [14] H.J. Bunge, Texture Analysis in Materials Science, Butterworths, London (1982)