Microstructural design and tailoring of advanced materials; the impact of electron microscopy.

• Autorzy: Thomas G.
• Konferencja: XV Physical Metallurgy and Materials Science Conference on Advanced Materials & Technologies, AMT'98, Kraków-Krynica 17-21May 1998, Poland
• Języki publikacji: EN

Abstrakty

EN

In order to tailor microstructure to archieve predetermined properties it is necessary to understand and control the processing-structure-property relationships, which is the heart of material science. Electron microscopy has become one of the primary methods of characterizing the micro- and mesostructures of materials, due to its high resolution capabilities now approaching 1A, in real space. In addition, by monitoring the signals generated by both elastic and inelastic scattering, detailed information is also obtainable on the crystal structure and composition of the specimen down to very small volumes, so facilitating analyses of nanostructures, thin films and multilayers in addition to analyses of specimens of bulk materials. In this paper some representative examples of the applications of the electron microscopy towards tailoring microstructure are summarized.

Słowa kluczowe

EN

microstructure; material science; microstructural design; electron microscopy

PL

mikrostruktura; materiałoznawstwo; projektowanie mikrostrukturalne; mikroskopia elektronowa

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Inżynieria Materiałowa
• Rocznik: 1998
• Tom: R. XIX, nr 3
• Strony: 75--90
• Opis fizyczny: Bibliogr. 2 poz., tab., rys.

Twórcy

autor

Thomas G.

• University of California, Berkeley, USA

• University of California, Berkeley, USA

Bibliografia

• [1] G. Thomas and M. J. Goringe, Transmission Electron Microscopy of Materials G. Viley, 1981, reprinted by Tech Books, Virginia. USA.
• [2] D. B. Williams and C. B. Carter, Transmission Electron Microscopy, Plenum Press, 1996