Arbitrary waveform generator for charge-pumping

• Autorzy: Iwanowicz M. , Pióro Z. , Łukasiak L. , Jakubowski A.
• Języki publikacji: EN

Abstrakty

EN

The paper presents a new signal generator for charge-pumping. Modular structure of the generator is discussed with special emphasis on signal-generation module consisting of five independent signal channels. Digital signal synthesis is chosen to minimize inaccuracies. Noise analysis is performed to demonstrate the validity of the design of signal channel. Calibration procedure is also discussed.

Słowa kluczowe

EN

arbitrary waveform generator,; calibration; charge-pumping; digital synthesis; noise

• Wydawca: Instytut Łączności - Państwowy Instytut Badawczy
• Czasopismo: Journal of Telecommunications and Information Technology
• Rocznik: 2007
• Tom: nr 3
• Strony: 78--83
• Opis fizyczny: Bibliogr.11 poz., il., tab.

Twórcy

autor

Iwanowicz M.

autor

Pióro Z.

autor

Łukasiak L.

autor

Jakubowski A.

• Institute of Microelectronics and Optoelectronics, Warsaw University of Technology Koszykowa st 75, 00-662 Warsaw, Poland,

Bibliografia

• [1] S. Szostak, “Metoda pompowania ładunku w strukturach SOI – model i charakteryzacja parametrow”, Ph.D. thesis, Warsaw University of Technology, 2001 (in Polish).
• [2] L. Łukasiak, S. Szostak, B. Nowak, A. Jakubowski, and R. Gawryś, “Metoda pompowania ładunku jako narzędzie do charakteryzacji przyrządow MOS”, Elektronika, vol. 38, no. 4, p. 10, 1997 (in Polish).
• [3] Keithley “Instruction Manual Keithley 7174A”, http://www.keithley.com/
• [4] M. Iwanowicz, Z. Pioro, L. Łukasiak, and A. Jakubowski, “Arbitraży waveform generator for charge pumping”, in 7th Symp. Diagn. Yield Adv. Silic. Dev. Technol. VLSI Era, Warsaw, Poland, 2006.
• [5] MAXIM “3.3 V, 16-bit, 500 Msps high dynamic performance DAC with differential LVDS inputs”, www.maxim-ic.com/
• [6] P. Horowitz and W. Hill, The Art of Electronics. Cabridge: Cabridge University Press, 1989.
• [7] Texas Instruments, “Noise analysis in operational amplifier circuits”, Application Report 1999, http://www.ti.com/
• [8] Texas Instruments, “Noise analysis for high-speed op amps”, Jan. 2005, http://www.ti.com/
• [9] Silicon Laboratories, “C8051F060/1/2/3/4/5/6/7 Mixed Signal ISP Flash MCU Family”, 2004.
• [10] THALER CORPORATION, “VRE405 Precision Dual Reference”, VRE405DataSheet, May 1996.
• [11] Chadwin Delin Young, “Charge trapping characterization methodology for the evaluation of hafnium – based gate dielectric film systems”, Electrical and Computer Engineering, Raleigh NC, Nov. 2003.