Sensitivity analysis of electromagnetic quantities by means of FEM

• Autorzy: Gawrylczyk K. M.
• Języki publikacji: EN

Abstrakty

EN

Sensitivity analysis determines the dependence of global or local electromagnetic quantities on geometrical or physical parameters expressed in the form of an objective function. The final aim of the field calculation methods is generally the design of an electromagnetic device. Solution of inverse problem on the basis of the finite elements method (FEM) makes the optimal shape design possible, as well as the identification of material cracks and flaws inside the conducting materials with the help of the eddy-current method. These tasks can be defined similarly for recognition of the spatial distribution of material parameters. The recognition takes place in iterative manner, basing on gradient information derived from the sensitivity analysis. The work deals with sensitivity evaluation in conjunction with finite element algorithms. It will be shown that the sensitivity analysis necessary to solve an inverse problem, requires only a low additional calculation cost.

Słowa kluczowe

EN

sensivity analysis; crack detection; eddy current method; finite element method; flaw detection; inverse problem; iterative methods; optimisation; electromagnetic quantities; objective function; non-destructive test; electromagnetism

PL

analiza wrażliwości; wykrywanie pęknięć; metoda prądu wirowego; metoda elementów skończonych; defektoskopia; zagadnienie odwrotne; metoda iteracyjna; optymalizacja; funkcja celu; próba nieniszcząca; elektromagnetyzm

• Wydawca: Instytut Podstawowych Problemów Techniki PAN
• Czasopismo: Journal of Technical Physics
• Rocznik: 2002
• Tom: Vol. 43, no 3
• Strony: 323--334
• Opis fizyczny: Bibliogr. 3 poz., rys., wykr.

Twórcy

autor

Gawrylczyk K. M.

• Technical University of Szczecin

Bibliografia

• 1. L.O. Chua, P.M. Lin, Computer-aided analysis of electronic circuits, Prentice-Hall, New Jersey USA.
• 2. K.M. Gawrylczyk, Sensitiuity eualuation methods of electromagnetic ąuantities with FE- analysis, COMPEL, 17, 1/2/3, 78-84, 1998.
• 3. D.N. Dyck, D.A. Lowther, E.M. Freeman, A method of computing the sensitiuity of electromagnetic ąuantities to changes in materials and sources, IEEE Trans, on Magnetics, 30, 5, 3415-3418, September 1994.