Analysis of errors in on-wafer measurements due to multimode propagation in CB-CPW

• Autorzy: Lewandowski A. , Wiatr W.
• Języki publikacji: EN

Abstrakty

EN

We study for the first time errors in on-wafer scattering parameter measurements caused by the parasitic microstrip-like mode propagation in conductor-backed coplanar waveguide (CB-CPW). We determine upper bound for these errors for typical CPW devices such as a matched load, an open circuit, and a transmission line section. To this end, we develop an electromagnetic-simulations-based multimode three-port model for the transition between an air-coplanar probe and the CB-CPW. Subsequently, we apply this model to examine errors in the device S parameters de-embedded from measurements affected by the parasitic MSL mode. Our analysis demonstrates that the multimode propagation in CB-CPW may significantly deteriorate the S-parameters measured on wafer.

Słowa kluczowe

EN

on-wafer measurements; multimode propagation; error analysis; conductor-backed coplanar waveguide (CB-CPW); microstrip-like mode; numerical electromagnetic analysis; on-wafer probe; calibration; de-embedding; monolithic microwave integrated circuit (MMIC)

• Wydawca: Instytut Łączności - Państwowy Instytut Badawczy
• Czasopismo: Journal of Telecommunications and Information Technology
• Rocznik: 2005
• Tom: nr 2
• Strony: 16--22
• Opis fizyczny: Bibliogr. 15 poz., rys.

Twórcy

autor

Lewandowski A.

autor

Wiatr W.

• Institute of Electronic System, Warsaw University of Technology, Nowowiejska st 15/19, 00-661 Warsaw, Poland,