A versatile tool for extraction of MOSFETs parameters

• Autorzy: Tomaszewski D. , Kociubiński A. , Marczewski J. , Kucharski K. , Domański K. , Grabiec P.
• Języki publikacji: EN

Abstrakty

EN

Extraction of MOSFET parameters is a very important task for the purposes of MOS integrated circuits characterization and design. A versatile tool for the MOSFET parameter extraction has been developed in the Institute of Electron Technology (IET). It is used to monitor the technologies applied for fabrication of several groups of devices, e.g., CMOS ASICs, SOI pixel detectors. At present two SPICE MOSFET models (LEVEL = 1, 2) have been implemented in the extraction tool. The LEVEL = 3 model is currently being implemented. The tool combines different methods of parameter extraction based on local as well as global fitting of models to experimental data.

Słowa kluczowe

EN

MOSFETs parameters; SPICE; least squares method

• Wydawca: Instytut Łączności - Państwowy Instytut Badawczy
• Czasopismo: Journal of Telecommunications and Information Technology
• Rocznik: 2005
• Tom: nr 1
• Strony: 129--134
• Opis fizyczny: Bibliogr. 6 poz., il.

Twórcy

autor

Tomaszewski D.

• Institute of Elektron Technology, Lotników av. 32/46, 02-668 Warsaw, Poland

autor

Kociubiński A.

• Institute of Electron Technology Lotników av. 32/46 02-668 Warsaw, Poland

autor

Marczewski J.

• Institute of Electron Technology Lotników av. 32/46 02-668 Warsaw, Poland

autor

Kucharski K.

• Institute of Electron Technology Lotników av. 32/46 02-668 Warsaw, Poland

autor

Domański K.

• Institute of Electron Technology Lotników av. 32/46 02-668 Warsaw, Poland

autor

Grabiec P.

• Institute of Electron Technology Lotników av. 32/46 02-668 Warsaw, Poland

Bibliografia

• [1] L. Łukasiak, Modele i elektryczne metody charakteryzacji przyrz¡dów MOS i MOS SOI. Warszawa: WPW, 2002 (in Polish).
• [2] BSIM4 model speciffcation, http://www device.eecs.berkeley.edu/ bsim3/ bsim4.html
• [3] "IC-CAP parameter extraction and device modeling software", http://eesof.tm.agilent.com/ products/85190a-a.html
• [4] W. Findeisen, J. Szymanowski, and A.Wierzbicki, Teoria i metody obliczeniowe optymalizacji. 2nd ed., Warszawa: PWN, 1980 (in Polish).
• [5] "METRICS documentation, METRICS technology", http://www.metricstech.com
• [6] J. Zaj¡c, J. Wójcik, A. Kociubiński, and D. Tomaszewski, "Semiautomatic test system for characterization of ASIC/MPWs", in 6th Symp. Diagn. & Yield 2003, Warsaw, Poland, 2003.