Semi-automatic test system for characterization of ASIC/MPWS

• Autorzy: Zając J. , Wójcik J. , Kociubiński A. , Tomaszewski D.
• Języki publikacji: EN

Abstrakty

EN

A measurement system for integrated circuit testing has been developed. It consists of a semi-automatic probe station and a set of measurement equipment controlled by commercially available measurement software. The probe station is controlled by dedicated software. Both the measurement and station-control software communicate using the DDE protocol. The measurement system is flexible. It is particularly suitable for semi-automatic testing of multi-project wafers. Output data generated by the system is used for the characterization of the CMOS technologies.

Słowa kluczowe

EN

automatic testing; diagnostics of technology; multi-project wafers

• Wydawca: Instytut Łączności - Państwowy Instytut Badawczy
• Czasopismo: Journal of Telecommunications and Information Technology
• Rocznik: 2005
• Tom: nr 1
• Strony: 124--128
• Opis fizyczny: Bibliogr. 6 poz., il.

Twórcy

autor

Zając J.

• Industrial Institute of Electronics, Długa st 44/50, 00-241 Warsaw, Poland

autor

Wójcik J.

• Industrial Institute of Electronics, Długa st 44/50, 00-241 Warsaw, Poland

autor

Kociubiński A.

• Institute of Electron Technology Lotników av. 32/46 02-668 Warsaw, Poland

autor

Tomaszewski D.

• Institute of Electron Technology Lotników av. 32/46 02-668 Warsaw, Poland

Bibliografia

• [1] H. Rodent, "Supportingin the clipboard, ODE and OLE in applications", MSDN Library Visual Studio 6.0, 1992.
• [2] H. Rodent, "Quick and easy DDE server", MSDN Library Visual Studio 6.0, 1992.
• [3] "METRICS documentation", http://www.metricstech.com
• [4] J. Marczewski et al., "Monolithic silicon pixel detectors in SOI technology", in Linear Coll. Worksh., Prague, Czech Republic, 2002, http://www-hep2.fzu.cz/ecfadesy/Talks/Vertex Detector/Marczewski Jacek Prague ECFA DESY.pps
• [5] M. Barański et al., "TSSOI as an effcient tool for diagnostics of SOI technology in the IET", in 6th Symp. Diagn.&Yield, Warsaw, Poland, 2003.
• [6] D. Tomaszewski et al., "A versatile tool for MOSFETs parameters extraction", in 6th Symp. Diagn.&Yield, Warsaw, Poland, 2003.