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A Monitoring platform for distributed Java applications

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Języki publikacji
EN
Abstrakty
EN
This paper presents a new Java oriented monitoring infrastructure that enables tools to observe, analyze and manipulate the execution of distributed Java applications independent of implementation details like instrumentation of monitored entities, hardware platform and application libraries. Tools can access the monitored application via a standardized interface defined by an On-Line Monitoring Interface Specification (OMIS) and extended by a set of new Java-specific services relating to garbage collection, class loading, remote method invocation, etc. The new monitoring functionality can be applied for building various kinds of tools and for adapting the already existing ones, such as performance analyzers, debuggers, etc., working in the on-line mode.
Rocznik
Strony
525--536
Opis fizyczny
Bibliogr. 23 poz., rys.
Twórcy
autor
  • Institute of Computer Science, AGH University of Science and Technology, Al. Mickiewicza 30, 30-059 Cracow, Poland
autor
  • Institute of Computer Science, AGH University of Science and Technology, Al. Mickiewicza 30, 30-059 Cracow, Poland
  • Academic Computer Centre CYFRONET, Nawojki 11, 30-950 Cracow, Poland
autor
  • Institute of Computer Science, AGH University of Science and Technology, Al. Mickiewicza 30, 30-059 Cracow, Poland
autor
  • Fachgruppe BVS – Universit¨at Siegen, H¨olderlinstr. 3, D-57068, Siegen, Germany
Bibliografia
  • [1] Bubak M, Funika W, Mętel P, Orłowski R and Wism¨uller R 2002 Proc. 4 th Int. Conf. PPAM 2001, Naleczow, Poland, LNCS 2328 315
  • [2] Bubak M, Funika W, Smętek M, Kiliański Z and Wism¨uller R 2003 Proc. 10 th European PVM/MPI Users’ Group Meeting, Venice, Italy, LNCS 2840 447
  • [3] Bubak M, Funika W, Wism¨uller R, Mętel P and Orłowski R 2003 Future Generation Computer Systems 19 651
  • [4] Bubak M, Funika W, Smętek M, Kiliański Z and Wism¨uller R 2004 Proc. 5 th Int. Conf. PPAM, Czestochowa, Poland, LNCS 3019 352
  • [5] Funika W, Bubak M, Smętek M and Wism¨uller R 2004 Proc. Int. Conf. on Computational Science, Cracow, Poland, LNCS 3038 472
  • [6] Sun Microsystems: Java Virtual Machine Profiler Interface (JVMDI), http://java.sun.com/j2se/1.4.2/docs/guide/jpda/jvmdi-spec.html
  • [7] Sun Microsystems: Java Virtual Machine Profiler Interface (JVMPI), http://java.sun.com/j2se/1.4.2/docs/guide/jvmpi/jvmpi.html
  • [8] The SDK Profiler, http://www.javaworld.com/javaworld/jw-12-2001/jw-1207-hprof.html
  • [9] Sun’s Heap Analysis Tool (HAT) for Analysing Output from hprof, http://java.sun.com/developer/onlineTraining/Programming/JDCBook/hat bin.zip
  • [10] JTracer Tool, http://amslib.free.fr/
  • [11] Java Profiler J-Sprint, http://www.j-sprint.com/
  • [12] JProfiler, http://www.ej-technologies.com/jprofiler/overview.html
  • [13] The OptimizeIt! Performance Profiler, http://www.optimizeit.com/
  • [14] JTest, http://www.parasoft.com/jsp/products/home.jsp?product=Jtest
  • [15] JProbe, http://java.quest.com/jprobe/jprobe.shtml
  • [16] JView, http://www.devstream.com/
  • [17] Kazi I H, Jose D P, Ben-Hamida B, Hescott C J, Kwok C, Konstan J, Lilja D J and Yew P-C 2000 IBM Systems Journal 39 (1) 96; http://www.research.ibm.com/journal/sj/391/kazi.html
  • [18] Sun Microsystems: Java Platform Debug Architecture (JPDA), http://java.sun.com/j2se/1.4.2/docs/guide/jpda/
  • [19] Java Management Extensions, http://java.sun.com/products/JavaManagement http://java.sun.com/j2se/1.5.0/docs/guide/management/
  • [20] Ludwig T, Wism¨uller R, Sunderam V and Bode A 1997 OMIS – On-line Monitoring InterfaceSpecification (Version 2.0), Shaker Verlag, Aachen, LRR-TUM Research Report Series 9, http://wwwbode.in.tum.de/˜omis/OMIS/Version-2.0/-version-2.0.ps.gz
  • [21] Wism¨uller R Trinitis J and Ludwig T 1998 Proc. Euro-Par’98, Parallel Processing, Southampton, UK, LNCS 1470 173
  • [22] Sun Microsystems: Java Native Interface (JNI), http://java.sun.com/j2se/1.4.2/docs/guide/jni/
  • [23] Gamma E, Helm R, Johnson R and Vlissides J 1995 Design Patterns, Addison-Wesley
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-BAT3-0014-0006
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