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Ilościowa analiza porowatości materiału sypkiego z zastosowaniem systemu tomografii promieniowania X

Treść / Zawartość
Identyfikatory
Warianty tytułu
EN
Quantitative analysis of bulk solids porosity with use of X-Ray tomography system
Języki publikacji
PL
Abstrakty
PL
Artykuł opisuje możliwości zastosowania tomografu opartego na promieniowaniu X do pomiaru porowatości materiału sypkiego o gęstym upakowaniu, znajdującego się w prostokątnym modelu silosu. Otrzymane wstępne wyniki prac doświadczalnych ukazują możliwości pomiarowe użytego systemu. Zaprezentowane rezultaty dotyczą statycznego pomiaru piasku w silosie. Porównane zostały dwa różne obszary silosu, z różnym rodzajem upakowania piasku i przeprowadzona została analiza jakościowa uzyskanych wyników. Przedstawiono również teoretyczny opis wpływu parametrów poszczególnych składników tomografu X na jakość uzyskiwanych rezultatów. Została przedyskutowana procedura przygotowania i dobrania najodpowiedniejszych ustawień narzędzia pomiarowego w celu jak najlepszej analizy ilościowej obrazów tomograficznych.
EN
Paper presents feasibility study of X Ray tomography system application to porosity measurement of dense packed bulk solid in rectangular silo model. Obtained preliminary experimental results reveal the measurement capabilities of the tested system. Results presented are for static measurement of silo sand filling. There is a comparison between two different silo regions, with different packing density values of sand, and qualitative analysis of results is performed. Theoretical description of distinct parameters of X Ray tomography system parts influence on quality of obtained results is presented. Additionally, the discussion on procedure of preparation and adjustment of measurement system parameters in order to achieve best data for quantitative analysis of tomography images is cover in this paper.
Wydawca
Rocznik
Strony
1269--1284
Opis fizyczny
Bibliogr. 39 poz., rys., wykr., tab
Twórcy
autor
  • Katedra Informatyki Stosowanej, Politechnika Łódzka
autor
  • Universite de Lyon, INSA-Lyon, MATEIS CNRS, Villeurbanne, France
autor
  • Katedra Informatyki Stosowanej, Politechnika Łódzka
  • Katedra Informatyki Stosowanej, Politechnika Łódzka
autor
  • Katedra Informatyki Stosowanej, Politechnika Łódzka
Bibliografia
  • [1] Aach T., Metzler VH., Defect interpolation in digital radiography: how object-oriented transform coding helps. Proc. SPIE, vol. 4322, 2001.
  • [2] Babout L., Maire E. Fougeres R., Damage initiation in model metallic materials: X-ray tomogra- phy and modeling. Acta Materialia, vol. 52, 2004, 2475-2487.
  • [3] Baruchel J., Buffiere J.-Y., Maire E., Merle P., Peix G., X-ray Tomography in Materiał Science. Hermes, Paris, 2000, 204.
  • [4] Beck MS., Plaskowski A., Cross Correlation Flowmeters: Their Application and Design. Adam Hilger, Bristol, 1987.
  • [5] Benuzzi-Mounaix A., Loupias B., Koenig M., Ravasio A., Ozaki N., Rabec le Gloahec M., Vinci T., Aglitskiy Y., Faenov A., Pikuz T., Boehly T., Density measurement oflow-Z shocked materiał from monochromatic x-ray two-dimensional images. Physical Review, vol. 77 (2), issue 4, 2008.
  • [6] Buifićre J.-Y, Cloetens P., Ludwig W., Maire E., Salvo L., In Situ X-Ray Tomography Studies of Microstructural Evolution Combined with 3D Modeling. MRS Bulletin, vol. 33, 2008, 611-619.
  • [7] Caulkin R., X. Jia, C. Xu M. Fairweather R.A., Williams H., Stitt M., Nijemeisland S., Aferka M., Crine A., Le'onard, Toye D., Marchot P., Simulations of Structures in Packed Columns and Vali- dation by X-ray Tomography. Ind. Eng. Chem. Res. 2009, 48, 2009, 202-213.
  • [8] Cleotens P., Pateyron-salome M., Buffiere J.-Y, Peix G., Baruchel J., Peyrin F., Schlenker M., Observation of microstruture and damage in materials by phase sensitive radiography and tomo graphy. J. Appl. Phys., vol. 81, No. 9, 1997, 5878-5886.
  • [9] Duliu OG., Computer axial tomography in geosciences: an overview. Earth-Science Reviews, 48, 1999, 265-281.
  • [10] Dyakowski T., Jeanmeure L.F.C., Jaworski A.J., Applications of electrical resistance tomography for gas-liquid and liąuid-solids flows - a review. Powder Technology, vol. 112, 2000, 174-192.
  • [11] Feser M., Gelb J., Chang H., Cui H., Duewer F., Lau SH., Tkachuk A., Yun W., Sub-micron resolution CTfor failure analysis andprocess development. Meas. Sci. Technol., 19, 2008.
  • [12] Fischer F., Hoppel D., Schleicher E., Mattausch G., Flaske H., Bartel R., Hampel U., An ultra fast electron beam x-ray tomography scanner. Meas. Sci. Technol., 19, 2008.
  • [13] Fu X., Dutt M., Bentham A.C., Hancock B.C., Cameron RE., Elliott JA., Investigation of particle packing in model pharmaceutical powders using X-ray microtomography and discrete element method. Powder Technology, 167, 2006, 134-140.
  • [14] Grassler T., Wirth K.-E., X-ray Computed Tomography in Mechanical Engineering — A Non-intrusive techniąue to Characterize Yerical Multiphase Flows. Proc. Computerized Tomography for Industrial Applications and Image Processing in Radiology, Berlin, Germany, 1999, 203-219.
  • [15] Hale J., The fundamentals of radiological science. Thomas, Springfield, 111., 1974.
  • [16] Halmshaw R., The effect of focal spot size in industrial radiography. British Journal of NDT, vol. 34, No. 8, 1992, 389-394.
  • [17] Hampel U., Fischer F., Bieberle M., Schleicher E., Recent progress in ultra fast electron beam X-ray computed tomography. 5th International Symposium on Process Tomography in Poland, Zakopane, 2008.
  • [18] Hampel U., Speck M., Koch D., Menz H.-J., Mayer H.-G., Fietz J., Hoppe D., Schleicher E., Zippe; C, Prasser H.-M., Ultrafast X-ray computed tomography with a linearly scanned electron beam source. Flow Measurement and Instrumentation, vol. 16, 2005, 65-72.
  • [19] Herman GT., Image reconstruction from projections: the fundamentals of computerized tomography. Academic Press, New York, NY, 1980.
  • [20] Hiriyannaiah HP., X-ray Computed Tomography for Medical Imaging. IEEE Signal Processing Magazine, 42-59.
  • [21] Hoyle BS., Jia X., Podd FJW., Schlaberg HI., Wang M, West RM., Williams RA., York Т., Design and application of a multi-modal process tomography system. Meas. Sei. Technol., 12, 2001, 1157-1165.
  • [22] http://www.phoenix-xray.com/en/mdex.php, http://www.skyscan.be/home.htm, http://www.xtekxray.com/, http://www.xradia.com.
  • [23] Huang S.M., Xie CG., Salkeld J.A., Piastowski A., Thorn R., Williams R., Hunt A. i Beck M.S., Process tomography for identification, design, and measurement in industrial systems. Powder Technology, 69, 1992, 85-92.
  • [24] Jia X., Williams R.A., A packing algorithm for particles of arbitrary shapes. Powder Technology 120, 2001, 175-186.
  • [25] Как A.C., Slaney M., Principles of Computerized Tomographie Imaging. Piscataway, NJ: IEEE, 1988, 49-112.
  • [26] Ketcham R.A., Carlson W.D., Acquisition, optimization and interpretation of X-ray computed to- mographic imagery: applications to the geosciences. Computers & Geosciences, 27, 2001, 381- 400.
  • [27] Lewitt RM., Recosntruction algorithms : transform methods. Proceedings of the IEEE, vol. 71, No 3, 1983, 390-408.
  • [28] Maire E., Carmona V., Courbon J., Ludwig W., Fast X-ray tomography and acoustic emission study of damage in metals during continuous tensile tests. Acta Materialia, vol. 55, 2007, 6806— 6815.
  • [29] Maire E., Adrien J., Vincent C, Bufficre J.-Y., Courbon J., In situ experiments in Xray tomography using synchrotron and standard laboratory tomographs. 5th International Symposium on Process Tomography in Poland, Zakopane, 2008.
  • [30] Nattierer F., Numerical methods in tomography. Acta-Numerica, vol. 8, 1999, 107-1.
  • [31] Pląskowski A., Beck M.S., Thorn R, Dyakowski Т., Imaging Industrial Flows. IOP Publishing, Bristol, 1995.
  • [32] Reinecke N., Mewes D., Recent developments and industrial research applications of capacitance tomography. Meas. Sei. Technol., vol. 7, 1996, 325-37.
  • [33] Scott D.M., McCann H., Process Imaging for automatic control. Taylor and Francis Group, 2005, 439.
  • [34] Stock S.R., X-ray microtomography of materials. International Materials Reviews, 44, 1999, 141-164.
  • [35] TerPogossian M., The Physical Aspects of Diagnostic Radiology. Harper and Row, New York, NY, 1967.
  • [36] Toyokawa H., Industrial imaging method using high-energy photon beam CT. 3rd International Workshop on Process Tomography (IWPT-3), Tokyo, Japan, 2009, 1-7.
  • [37] Williams R.A., Beck M.S. eds., Process Tomography — Principles, Techniques and Applications. Butterworth-Heinemann, Oxford, 1995, 507.
  • [38] Williams RA., Jia X., Tomographie imaging ofparticulate system. Advanced Powder Technology, 14,2003, 1-16.
  • [39] Xu F., Liu H., Wang G., Alford BA., Comparison of adaptive linear interpolation and conventional linear interpolation for digital radiography systems. Journal of Electronic Imaging, 9(1), 2000, 22-31.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-AGH1-0022-0048
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