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Compositional analysis of silicon oxide/silicon nitride thin films

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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Hydrogen, amorphous silicon nitride (SiNx:H abbreviated SiNx) films were grown on multicrystalline silicon (mc-Si) substrate by plasma enhanced chemical vapour deposition (PECVD) in parallel configuration using NH3/SiH4 gas mixtures. The mc-Si wafers were taken from the same column of Si cast ingot. After the deposition process, the layers were oxidized (thermal oxidation) in dry oxygen ambient environment at 950 ºC to get oxide/nitride (ON) structure. Secondary ion mass spectroscopy (SIMS), Rutherford backscattering spectroscopy (RBS), Auger electron spectroscopy (AES) and energy dispersive X-ray analysis (EDX) were employed for analyzing quantitatively the chemical composition and stoichiometry in the oxide-nitride stacked films. The effect of annealing temperature on the chemical composition of ON structure has been investigated. Some species, O, N, Si were redistributed in this structure during the thermal oxidation of SiNx. Indeed, oxygen diffused to the nitride layer into Si2O2N during dry oxidation.
Słowa kluczowe
Wydawca
Rocznik
Strony
315--321
Opis fizyczny
Bibliogr. 24 poz., rys.
Twórcy
autor
  • CRTSE, Division Développement des Dispositifs de Conversion á Semi-conducteurs. 02 Bd Frantz Fanon, BP 140 Alger 7-Merveilles 16038, Algeria
autor
  • CRTSE, Division Développement des Dispositifs de Conversion á Semi-conducteurs. 02 Bd Frantz Fanon, BP 140 Alger 7-Merveilles 16038, Algeria
autor
  • CRTSE, Division Développement des Dispositifs de Conversion á Semi-conducteurs. 02 Bd Frantz Fanon, BP 140 Alger 7-Merveilles 16038, Algeria
  • Laboratoire des semi-conducteurs et oxydes métalliques, Université des Sciences et de la Technologie Houari Boumediene, BP 32 El Alia, Bab Ezzouar Alger, Algeria
Bibliografia
  • [1] Sze S.M., J. Appl. Phys., 38 (1967), 2951.
  • [2] El Amrani A., Bekhtari A., Mahmoudi B., Lefgoum A., Menari H., Vacuum, 86 (2011), 386.
  • [3] Parm I.O., Kim K., Lim D.G., Lee J.H., Heo J.H., Kim J., Kim D.S., Lee S.H., Yi J., Sol. Energ. Mat. Sol. C, 74 (2002), 97.
  • [4] Liang Z., Shen H., Li J., Xu N., Sol. Energy, 72 (2002), 505.
  • [5] Ay F., Aydinli A., Opt. Mater., 26 (2004), 33.
  • [6] Taguchi S.P., Ribeiro S., J. Mater. Process Tech., 147 (2004), 336.
  • [7] Aberle A.G., Prog. Photovolt. Res. Appl., 8(2000), 473.
  • [8] Panek P., Drabczyk K., Focsa A., Slaoui A., Mater. Sci. Eng. B-Adv., 165 (2009), 64.
  • [9] Hofmann M., Schneiderlochner E., Wolke W., Preu R., Silicon Nitride-Silicon Oxide Stacks for Solar Cell Rear Side Passivation, 19th European Photovoltaic Solar Energy Conference, 7 – 11 June 2004, Paris.
  • [10] Pan X., J. Am. Ceram. Soc., 79 (1996), 2975.
  • [11] Du H., Tressler R.E., Spear K.E., J. Electrochem. Soc., 136 (1989), 3210.
  • [12] Banerji N., Serra J., Gonzalez P., Chiussi S., Parada E., Leon B., Perez-Amor M., Thin Solid Films, 317 (1998), 214.
  • [13] Lee S., Kim B., Kim J-Y., An H-M., Seo K-Y., Thin Solid Films, 515 (2007), 6915.
  • [14] Bersani M., Vanzetti L., Sbetti M., Anderle M., Appl. Surf. Sci., 144 – 145 (1999), 301.
  • [15] Frost M.R., Magee C.W., Appl. Surf. Sci., 104 – 105 (1996), 379.
  • [16] Bouvet D., Clivaz P.A., Dutoit M., Coluzza C., Almeida J., Margaritondo G., Pio F., J. Appl. Phys., 79 (1996), 7114.
  • [17] Mayer M., SIMNRA User’s Guide . Report IPP, Vol. 9/113, Max-Planck-Institut fur Plasmaphysik, Garching, 1997.
  • [18] Poon M.C., Gao Y., Kok T.C.W., Myasnikov A.M., Wong H., Microelectron. Reliab., 41 (2001), 2071.
  • [19] Kimura K., Nakajima K., Kobayashi H., Miwa S., Satori K., Appl. Surf. Sci., 203 – 204 (2003), 418.
  • [20] Hong J., Kessels W.M.M., Soppe W., Rieffe H.C., Weeber A.W., Sanden van de M.C.M., 3rdWorld Conference on Photovoltaic Energy Conversion, Osaka, Japan, Arisumi Printing Inc., Osaka, 2003, p. 1158.
  • [21] Weeber A.W., Rieffe H.C., Sinke W.C., Soppe W.J., Proceedings of the 19th European Photovoltaic Solar Energy Conference, Paris, 2004, p. 1005.
  • [22] Jehanathan N., Saunders M., Liu Y., Dell J., Scripta Mater., 57 (2007), 739.
  • [23] Lelievre J.F., Fourmand E., Kaminski A., Palais O., Ballutaud D., Lemiti M., Sol. Energ. Mat. Sol. C., 93 (2009), 1281.
  • [24] Vila M., Martin-Gago J.A., Munoz-Martin A., Prieto C., Miranzo P., Osendi M.I., Garcialopez J., Respaldiza M.A., Vacuum, 67 (2002), 513.
Uwagi
Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-af4b94d2-f30b-4c8e-9f16-fa9e6d0148e8
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