Surface Effect on the Buckling of a Stretchable Electronic Structure

• Autorzy: Zhang X. , Ou Z. , Yao X.

Warianty tytułu

PL

Wpływ podłoża na odkształcenie elastycznej struktury elektronicznej

• Języki publikacji: EN

Abstrakty

EN

The structure of a stiff thin film on a compliant substrate has important applications in stretchable electronics. However, such structures are micro-nano-order of magnitude, where surface effects cannot be ignored. Gurtin-Murdoch theory is applied to model the thin film including surface effects. Through energy method, the size-dependent relations between the buckling features, material properties and geometric parameters are deduced. At last the influence of surface effects is illustrated by the case of silicon film and PDMS substrate.

PL

Badano strukturę cienkiej warstwy nałożonej na podłoże. Taka struktura może mieć rząd nanometrów kiedy efekt podłoża nie może być ignorowany. Zaproponowano model matematyczny struktury bazując na teorii Gurtin-Murdoch.

Słowa kluczowe

EN

surface effect; compliant structure; thin film; buckling

PL

elektronika; struktura elektroniczna; model matematyczny

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Przegląd Elektrotechniczny
• Rocznik: 2012
• Tom: R. 88, nr 9b
• Strony: 137--140
• Opis fizyczny: Bibliogr. 10 poz., rys., tab., wykr.

Twórcy

autor

Zhang X.

• School of Civil Engineering and Transportation,South China University of Technology,Guangzhou,China

autor

Ou Z.

• School of Civil Engineering and Transportation,South China University of Technology,Guangzhou,China

autor

Yao X.

• School of Civil Engineering and Transportation,South China University of Technology,Guangzhou,China

Bibliografia

• [1] Song, J., H. Jiang, Z. J. Liu, D. Y. Khang, Y. Huang, J. A. Rogers, C. Lu, and C. G. Koh, Buckling of a stiff thin film on a compliant substrate in large deformation, International Journal of Solids and Structures, 45 (2008), No.10, 3107-3121.
• [2] Huang, Z. Y.,W. Hong,Z. Suo, Nonlinear analyses of wrinkles in a film bonded to a compliant substrate, Journal of the Mechanics and Physics of Solids, 53 (2005), No.9, 2101-2118.
• [3] Gurtin, Morton E.,A. Ian Murdoch, A continuum theory of elastic material surfaces, Archive for Rational Mechanics and Analysis, 57(1957), No.4, 291-323.
• [4] Gurtin, Morton E.,A. Ian Murdoch, Surface stress in solids, International Journal of Solids and Structures, 14 (1978), No.6, 431-440.
• [5] Miller, R. E.,V. B. Shenoy, Size-dependent elastic properties of nanosized structural elements, Nanotechnology, 11(2000), No.3, 139-147.
• [6] Lim, C. W.,L. H. He, Size-dependent nonlinear response of thin elastic films with nano-scale thickness, International Journal of Mechanical Sciences, 46 (2004), No.11, 1715-1726.
• [7] Lu, P.,L. H. He,H. P. Lee,C. Lu, Thin plate theory including surface effects, International Journal of Solids and Structures, 43 (2006)No.16, 4631-4647.
• [8] Gurtin, Morton E.,A. Ian Murdoch, Addenda to our paper a continuum theory of elastic material surfaces, Archive for Rational Mechanics and Analysis, 59 (1975), No.4, 291-323.
• [9] Hopcroft, M. A.,W. D. Nix,T. W. Kenny, What is the Young's Modulus of Silicon?, Journal of Microelectromechanical Systems, 19 (2010), No.2, 229-238.
• [10] Wilder, E. A.,S. Guo,S. Lin-Gibson,M. J. Fasolka,C. M. Stafford, Measuring the modulus of soft polymer networks via a bucklingbased metrology, Macromolecules, 39 (2006), No.12, 4138-4143.