Tytuł artykułu
Wybrane pełne teksty z tego czasopisma
Identyfikatory
Warianty tytułu
Języki publikacji
Abstrakty
In this work, we prepared an ideal Cu/DNA/n-InP biopolymer-inorganic Schottky sandwich device formed by coating a n-InP semiconductor wafer with a biopolymer DNA. The Cu/DNA/n-InP contact showed a good rectifying behavior. The ideality factor value of 1.08 and the barrier height (Φb) value of 0.70 eV for the Cu/DNA/n-InP device were determined from the forward bias I-V characteristics. It was seen that the Φb value of 0.70 eV obtained for the Cu/DNA/n-InP contact was significantly larger than the value of 0.48 eV of conventional Cu/n-InP Schottky diodes. Modification of the interfacial potential barrier of Cu/n-InP diode was achieved using a thin interlayer of DNA biopolymer. This was attributed to the fact that DNA biopolymer interlayer increased the effective barrier height by influencing the space charge region of InP.
Słowa kluczowe
Wydawca
Czasopismo
Rocznik
Tom
Strony
593--600
Opis fizyczny
Bibliogr. 57 poz., rys.
Twórcy
autor
- Department of Physics, Faculty of Sciences and Arts, Batman University, Batman, Turkey
autor
- Department of Physics Eng., Faculty of Sciences, Istanbul Medeniyet University, Istanbul, Turkey
Bibliografia
- [1] KOEZUKA H., ETOH S., J. Appl. Phys., 54 (5) (1983), 2511.
- [2] KURATA T., KOEZUKA H., TSUNODA S., ANDO T., J. Phys. D Appl. Phys., 19 (4) (1986), L57.
- [3] TURUT A., KOLELI F., J. Appl. Phys., 72 (2) (1992), 818.
- [4] ONGANER Y., SAGLAM M., TURUT A., EFEOGLU H., TUZEMEN S., Solid State Electron., 39 (1996), 677.
- [5] GUPTA R., MISRA S.C.K., MALHOTRA B.D., BELADAKERE N.N., CHANDRA S., Appl. Phys. Lett., 58 (1991), 51.
- [6] AYDOGAN S., SAGLAM M., TURUT A., J. Phys.- Condens. Mat., 18 (9) (2006), 2665.
- [7] CAMAIONI N., CASALBORE-MICELI G., BEGGIATO G., CRISTANI M., SUMMONTE C., Thin Solid Films, 366 (2000), 211.
- [8] FORREST S.R., SCHMIDT P.H., J. Appl. Phys., 59 (1986), 513.
- [9] GULLU O., PAKMA O., TURUT A., J. Appl. Phys., 111 (2012), 044503.
- [10] SAMUEL M., MENON C.S., UNNIKRISHNAN N.V., Mater. Sci.-Poland, 25 (1) (2007), 177.
- [11] KILICOGLU T., AYDIN M.E., OCAK Y.S., Physica B, 388 (1, 2) (2007), 244.
- [12] KAMPEN T., SCHULLER A., ZAHN D.R. T., BIEL B., ORTEGA J., PEREZ R., FLORES F., Appl. Surf. Sci., 234 (2004), 341.
- [13] ZAHN D.R.T., KAMPEN T.U., MENDEZ H., Appl. Surf. Sci., 212 – 213 (2003), 423.
- [14] ROBERTS A.R.V., EVANS D.A., Appl. Phys. Lett., 86 (2005), 072105.
- [15] BOLOGNESI A., CARLO A.D., LUGLI P., KAMPEN T., ZAHN D.R.T., J. Phys.: Condens. Mat., 15 (2003), S2719.
- [16] RAJESH K.R., MENON C.S., J. Non-Cryst. Solids, 353 (4) (2007), 398.
- [17] FORREST S.R., KAPLAN M.L., SCHMIDT P.H., FELDMANN W.L., YANOWSKI E., Appl. Phys. Lett., 41 (1982), 90.
- [18] CAKAR M., TEMIRCI C., TURUT A., Chemphyschem, 8 (2002), 701.
- [19] AYDIN M.E., KILICOGLU T., AKKILIC K., HOSGOREN H., Physica B, 381 (2006), 113.
- [20] FORREST S.R., KAPLAN M.L., SCHMIDT P.H., J. Appl. Phys., 55 (1984), 1492.
- [21] ANTOHE S., TOMOZEIU N., GOGONEA S., Phys. Status Solidi A, 125 (1991), 397.
- [22] EBEOGLU M.A., KILICOGLU T., AYDIN M.E., Physica B, 395 (2007), 93.
- [23] HATTORI K., TORII Y., Solid State Electron., 34 (1991), 527.
- [24] SUGIUO T., SAKAMOTO Y., SUMIGUCHI T., NOMOTO K., SHIRAFUJI J., Jpn. J. Appl. Phys., 32 (1993), L1196.
- [25] SAKAMOTO Y., SUGINO T., MIYAZAKI T., SHIRAFUJI J., Electron. Lett., 31 (1995), 1104.
- [26] GULLU O., TURUT A., Sol. Energ. Mat. Sol. C., 92 (10) (2008), 1295.
- [27] BHALLA V., BAJPAI R. P., BHARADWAJ L.M., EMBO Rep., 4 (5) (2003), 442.
- [28] HWANG J.S., HWANG S.W., AHN D., Superlattice. Microst., 4 (2003), 433.
- [29] PORATH D., BEZRYADIN A., VRIES DE S., DEKKER C., Nature, 403 (2000), 635.
- [30] KASUMOV A.Y., KOCIAK M., GUERON S., REULET B., VOLKOV V.T., KLINOV D.V., BOUCHIAT H., Science, 291 (2001), 280.
- [31] YOO K.H., HA D.H., LEE J.O., PARK J.W., KIM J., KIM J.J., LEE H.Y., KAWAI T., CHOI H.Y., Phys. Rev. Lett., 87 (2001), 198102.
- [32] HWANG J.S., KONG K.J., AHN D., LEE G.S., AHN D.J., HWANG S.W., Appl. Phys. Lett., 81 (2002), 1134.
- [33] LI X.Q., YAN Y., J., Appl. Phys. Lett., 79 (2001), 2190.
- [34] STORM A.J., VAN NOORT J., VRIES DE S., DEKKER C., Appl. Phys. Lett., 79 (2001), 3881.
- [35] CAI L., TABATA H., KAWAI T., Appl. Phys. Lett., 77 (2000), 3105.
- [36] FINK H.W., SCHONENBERGER C., Nature, 398 (1999), 407.
- [37] JO Y.S., LEE Y., ROH Y., Mater. Sci. Eng. C, 23 (2003), 841.
- [38] ENDRES R.G., COX D.L., SINGH R.R.P., Rev. Mod. Phys., 76 (2004), 195.
- [39] KWOK H.L., IET Nanobiotechnol., 151 (6) (2004), 193.
- [40] QIU Y., QIAO J., Thin Solid Films, 372 (2000), 265.
- [41] RHODERICK E.H., WILLIAMS R.H., Metal- Semiconductor Contacts, Clarendon, Oxford, 1988.
- [42] SZE S.M., Physics of Semiconductor Devices, Wiley, New York, 1981.
- [43] SCHMITSDORF R.F., KAMPEN T.U., MONCH W., J. Vac. Sci. Technol. B, 15 (4) (1997), 1221.
- [44] MONCH W., J. Vac. Sci. Technol. B, 17 (4) (1999), 1867.
- [45] TUNG R.T., Phys. Rev. B, 45 (23) (1992), 13509.
- [46] VANALME G.M., GOUBERT L., MEIRHAEGHE VAN R.L., CARDON F., DAELE VAN P., Semicond. Sci. Tech., 14 (1999), 871.
- [47] CAKAR M., TEMIRCI C., TURUT A., Synthetic Met., 142 (2004), 177.
- [48] ZAHN D.R.T., PARK S., KAMPEN T.U., Vacuum, 67 (2002), 101.
- [49] MEIRHAEGHE VAN R.L., LAFLERE W.H., CARDON F., J. Appl. Phys., 76 (1) (1994), 403.
- [50] AYDOGAN S., SAGLAM M., TURUT A., Microelectron. Eng., 85 (2008), 278.
- [51] CHEUNG S.K., CHEUNG N.W., Appl. Phys. Lett., 49 (1986), 85.
- [52] TURUT A., SAGLAM M., EFEOGLU H., YALCIN N., YILDIRIM M., ABAY B., Physica B, 205 (1995), 41.
- [53] KILICOGLU T., Thin Solid Films, 516 (2008), 967.
- [54] KARATAS S., ALTINDAL S., TURUT A., CAKAR M., Physica B, 392 (1 – 2) (2007), 43.
- [55] WERNER J.H., GUTTLER H.H., J. Appl. Phys., 69 (1991), 1522.
- [56] GULLU O., AYDOGAN S., TURUT A., Microelectron. Eng., 85 (2008), 1647.
- [57] CARD H.C., RHODERICK E.H., J. Phys. D Appl. Phys., 4 (1971), 1589.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-ab2dc0ba-5d2d-42f5-87bf-54ac743dd961