Low-noise high-resolution CMOS readout ASIC for silicon strip X-ray detectors

• Autorzy: Zubrzycka-Singh Weronika

Identyfikatory

DOI

10.24425/opelre.2025.156670

• Języki publikacji: EN

Abstrakty

EN

This work presents the design, characterisation, and measurement results of the silicon strip sensor readout circuit for X-ray applications. The key design goals were a noise level below 50 electrons rms, low power consumption (below 10 mW per channel) and a compact layout. The prototype integrated circuit was designed and fabricated in a 180 nm CMOS technology, incorporating eight charge-processing channels, biasing circuits, reset and baseline restoration logic, and a calibration system.

Słowa kluczowe

EN

front-end electronics for detector readout; silicon microstrip detectors; X-ray detectors; very large scale integration (VLSI) circuits

• Wydawca: Stowarzyszenie Elektryków Polskich ; Polska Akademia Nauk ; Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego
• Czasopismo: Opto-Electronics Review
• Rocznik: 2025
• Tom: Vol. 33, No. 4
• Strony: art. no. e156670
• Opis fizyczny: Bibliogr. 16 poz., rys., wykr., tab.

Twórcy

autor

Zubrzycka-Singh Weronika

• Faculty of Electrical Engineering, Automatics, Computer Science and Biomedical Engineering, AGH University of Krakow, al. Adama Mickiewicza 30, 30-059 Kraków, Poland

• https://orcid.org/0000-0002-5884-2994

Bibliografia

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