Studies of CdI2-Bi3 microstructures with optical methods, atomic force microscopy and positron annihilation spectroscopy

• Autorzy: Karbovnyk I. , Bolesta I. , Rovetskii I , Velgosh S , Klym H.

Identyfikatory

DOI

10.2478/s13536-014-0215-z

• Języki publikacji: EN

Abstrakty

EN

Results of the comprehensive morphological study of CdI2–BiI3 layered crystals are presented. Direct AFM observations of micro- and nanostructures formed in the volume of the crystals confirm the predictions made on the basis of positron annihilation spectroscopy studies. The model explaining the possible pores formation mechanism is proposed and validated by the results of luminescence measurements at 8 K.

Słowa kluczowe

EN

layered crystals; microstructures; atomic force microscopy (AFM); positron annihilation

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2014
• Tom: Vol. 32, No. 3
• Strony: 391--395
• Opis fizyczny: Bibliogr. 16 poz., rys., tab., wykr.

Twórcy

autor

Karbovnyk I.

• Ivan Franko National University of Lviv, Ukraine

autor

Bolesta I.

• Ivan Franko National University of Lviv, Ukraine

autor

Rovetskii I

• Ivan Franko National University of Lviv, Ukraine

autor

Velgosh S

• Ivan Franko National University of Lviv, Ukraine

autor

Klym H.

• Lviv Polytechnic National University, Ukraine

Bibliografia

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