Application of cross-correlation-based transimpedance amplifier in InAs and InAsSb IR detectors noise measurements

• Autorzy: Achtenberg Krzysztof , Mikołajczyk Janusz , Bielecki Zbigniew

Identyfikatory

DOI

10.24425/opelre.2022.141126

• Języki publikacji: EN

Abstrakty

EN

The paper presents noise measurements in low-resistance photodetectors using a crosscorrelation-based transimpedance amplifier. Such measurements usually apply a transimpedance amplifier design to provide a current fluctuation amplification. In the case of low-resistance sources, the measurement system causes additional relevant system noise which can be higher than noise generated in a tested detector. It mainly comes from the equivalent input voltage noise of the transimpedance amplifier. In this work, the unique circuit and a three-step procedure were used to reduce the floor noise, covering the measured infrared detector noise, mainly when operating with no-bias or low-bias voltage. The modified circuit and procedure to measure the noise of unbiased and biased detectors characterized by resistances much lower than 100 Ω were presented. Under low biases, the reference low-resistance resistors tested the measurement system operation and techniques. After the system verification, noise characteristics in low-resistance InAs and InAsSb infrared detectors were also measured.

Słowa kluczowe

EN

cross-correlation; IR detector; noise; transimpedance amplifier; InAs; InAsSb

• Wydawca: Stowarzyszenie Elektryków Polskich ; Polska Akademia Nauk ; Wojskowa Akademia Techniczna im. Jarosława Dąbrowskiego
• Czasopismo: Opto-Electronics Review
• Rocznik: 2022
• Tom: Vol. 30, No. 2
• Strony: art. no. e141126
• Opis fizyczny: Bibliogr. 18 poz., rys., wykr., tab.

Twórcy

autor

Achtenberg Krzysztof

• Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego St., 00-908 Warsaw, Poland

• https://orcid.org/0000-0003-3806-9276

autor

Mikołajczyk Janusz

• Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego St., 00-908 Warsaw, Poland

• https://orcid.org/0000-0002-7091-3521

autor

Bielecki Zbigniew

• Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego St., 00-908 Warsaw, Poland

• https://orcid.org/0000-0002-2777-620X

Bibliografia

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