Educational scanning tunneling microscope – open architecture platform for nanotechnology teaching and nanometrology research

• Autorzy: Pruchnik Bartosz , Sikora Andrzej , Gajewski Krzysztof , Świadkowski Bartosz , Smagowski Piotr , Badura Dominik , Kwoka Krzysztof , Piasecki Tomasz , Gotszalk Teodor

Identyfikatory

DOI

10.15199/48.2024.06.41

Warianty tytułu

PL

Edukacyjny skaningowy mikroskop tunelowy-platforma o otwartej architekturze dla edukacji i badań nanometrologicznych

• Języki publikacji: EN

Abstrakty

EN

In this paper, we present the in-house hardware and software platform allowing to perform the demonstrations of the design and operation of scanning tunneling microscope (STM) and derivative diagnostic techniques, enabling the determination of the properties of the surface at the nanoscale. The main advantage of the described setup is an open architecture, which is essential in terms of providing full insight into certain aspects of the construction and the ways the measurements are performed. Due to the modular design of the platform, students can excel in their competencies within various forms of learning activity, including basic training classes and diploma works. The described solution is a unique setup that was developed using the experience of the researchers at the Department of Nanometrology, Wrocław University of Science and Technology.

PL

W pracy przedstawiamy platformę edukacyjnego skaningowego mikroskopu tunelowego pozwalającego na badania powierzchni w skali nanometrycznej. Zasadniczą zaletą zaprojektowanej konstrukcji jest jej otwarta architektura pozwalająca na prowadzenie różnorodnych eksperymentów zarówno dydaktycznych jak i wysokospecjalizowanych prac naukowych. Przedstawiony system został zaprojektowany w ramach prac dyplomowych i doktorskich w Katedrze Nanometrologii Wydziału Elektroniki, Fotoniki i Mikrosystemów Politechniki Wrocławskiej.

Słowa kluczowe

EN

scanning probe microscopy; scanning tunnelling microscopy; nanometrology; signal electronic

PL

mikroskopia bliskich oddziaływań; skaningowa mikroskopia tunelowa; nanometrologia

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Przegląd Elektrotechniczny
• Rocznik: 2024
• Tom: R. 100, nr 6
• Strony: 200--204
• Opis fizyczny: Bibliogr. 28 poz., rys., tab.

Twórcy

autor

Pruchnik Bartosz

• Politechnika Wrocławska, Katedra Nanometrologii, C-2, Janiszewskiego, 52-372 Wrocław

• https://orcid.org/0000-0003-1565-7278

autor

Sikora Andrzej

• Politechnika Wrocławska, Katedra Nanometrologii, C-2, Janiszewskiego, 52-372 Wrocław

• https://orcid.org/0000-0001-6649-1963

autor

Gajewski Krzysztof

• Politechnika Wrocławska, Katedra Nanometrologii, C-2, Janiszewskiego, 52-372 Wrocław

• https://orcid.org/0000-0001-6218-0658

autor

Świadkowski Bartosz

• Politechnika Wrocławska, Katedra Nanometrologii, C-2, Janiszewskiego, 52-372 Wrocław

• https://orcid.org/0000-0001-9197-1862

autor

Smagowski Piotr

• Politechnika Wrocławska, Katedra Nanometrologii, C-2, Janiszewskiego, 52-372 Wrocław

• https://orcid.org/0000-0002-5146-2868

autor

Badura Dominik

• Politechnika Wrocławska, Katedra Nanometrologii, C-2, Janiszewskiego, 52-372 Wrocław

• https://orcid.org/0000-0003-1300-642

autor

Kwoka Krzysztof

• Politechnika Wrocławska, Katedra Nanometrologii, C-2, Janiszewskiego, 52-372 Wrocław

• https://orcid.org/0000-0001-8482-301X

autor

Piasecki Tomasz

• Politechnika Wrocławska, Katedra Nanometrologii, C-2, Janiszewskiego, 52-372 Wrocław

• https://orcid.org/0000-0002-3187-1488

autor

Gotszalk Teodor

• Politechnika Wrocławska, Katedra Nanometrologii, C-2, Janiszewskiego, 52-372 Wrocław

• https://orcid.org/0000-0003-4182-9192

Bibliografia

• [1] Van de Leemput, L. E. C., and H. Van Kempen. "Scanning tunnelling microscopy." Reports on Progress in Physics 55.8 (1992): 1165.
• [2] Binnig, G., et al. "Surface studies by scanning tunneling microscopy." Physical review letters 49.1 (1982): 57.
• [3] Goryl, G., et al. "High resolution LT-STM imaging of PTCDA molecules assembled on an InSb (001) c (8× 2) surface." Nanotechnology 19.18 (2008): 185708.
• [4] Lewandowski, M., et al. "Moir\'e-free ultrathin iron oxide film: FeO (111) on Ag (111)." arXiv preprint arXiv:1608.01376 (2016).
• [5] Jałochowski, M., and Kwapiński, T. "Distribution of Electron Density in Self-Assembled One-Dimensional Chains of Si Atoms." Materials 16.17 (2023): 6044.
• [6] Cegiel, M., Bazarnik, M., and Czajka R. "STM investigation of cobalt silicide nanostructures’ growth on Si(111)-(√ 19 x √ 19) substrate." Central European Journal of Physics 7 (2009): 291- 294.
• [7] Wettingen, K., Merkli, S., Ovinnikov, I., Wild, D., Mann, W., Graf, T. Do It Yourself-Scanning Tunneling Microscope, www.stm-diy.ch (2008).
• [8] Zahl, P., et al. "Open source scanning probe microscopy control software package GXSM." Journal of Vacuum Science & Technology B 28.3 (2010): C4E39-C4E47.
• [9] Hellerstedt, J., et al. "Counting molecules: Python based scheme for automated enumeration and categorization of molecules in scanning tunneling microscopy images." Software Impacts 12 (2022): 100301..
• [10] Winkelmann, K., Mantovani, J., and Brenner, J. "A nanotechnology laboratory course for 1st year students." The 2005 Annual Meeting. (2005)
• [11] Seeger, A., et al. "Hands-on tools for nanotechnology." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 19.6 (2001): 2717-2722.
• [12] Jóźwiak G., Seraficzuk, J., Zawierucha, P., Zielony, M., Piasecki, T., Gotszalk, T., Szeloch, R. „Topograf – program do przetwarzania i analizy obrazów uzyskiwanych z mikroskopów SPM”, Komputerowe Wspomaganie Bada Nauk. XV. 27–32 (2008) 15.
• [13] Gotszalk, T. Systemy mikroskopii bliskich oddziaływań w badaniach mikro-i nanostruktur. Oficyna Wydawnicza Politechniki Wrocławskiej, 2004.
• [14] Kopiec, D., et al. "Metrology and control of electromagnetically actuated cantilevers using optical beam deflection method." Metrology and Measurement Systems (2021): 627- 642.
• [15] Świadkowski, B., et al. "ARMScope–the versatile platform for scanning probe microscopy systems." Metrology and Measurement Systems 27.1 (2020).
• [16] Chen, C. J. "Electromechanical deflections of piezoelectric tubes with quartered electrodes." Applied Physics Letters 60.1 (1992): 132-134.
• [17] Chen, C. J. "In situ testing and calibration of tube piezoelectric scanners." Ultramicroscopy 42 (1992): 1653-1658.
• [18] Ding, Z., et al. "Transport properties of graphene nanoribbon-based molecular devices." Journal of computational chemistry 32.4 (2011): 737-741.
• [19] Klapetek, P., et al. "Methods for determining and processing 3D errors and uncertainties for AFM data analysis." Measurement Science and Technology 22.2 (2011): 025501.
• [20] Swain, B. P. "Investigation of fractal behavior, optical properties and electronic environments of carbon-doped of ZnO Thin Films." Applied Physics A 127.5 (2021): 375.
• [21] Mani, K. K., and R. Ramani. "Lattice dynamics of graphite." physica status solidi (b) 61.2 (1974): 659-668.
• [22] Hoffmann, J., Alexander S., and Albert W. "Construction and evaluation of a traceable metrological scanning tunnelling microscope." Measurement 42.9 (2009): 1324-1329.
• [23] Zhang, H., Feng H., and Higuchi, T. "Dual unit scanning tunneling microscope-atomic force microscope for length measurement based on reference scales." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 15.4 (1997): 780-784.
• [24] Baro, A. M., Miranda, R., and Carrascosa, J. L. "Application to biology and technology of the scanning tunneling microscope operated in air at ambient pressure." IBM journal of research and development 30.4 (1986): 380-386.
• [25] Jalili, N., and Laxminarayana, K. "A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences." Mechatronics 14.8 (2004): 907-945.
• [26] Mohn, F., et al. "Different tips for high-resolution atomic force microscopy and scanning tunneling microscopy of single molecules." Applied Physics Letters 102.7 (2013).
• [27] Zandvliet, H. J. W., et al. "Scanning tunneling microscopy and spectroscopy of ion-bombarded Si (111) and Si (100) surfaces." Physical Review B 46.12 (1992): 7581.
• [28] Porte, L., De Villeneuve, C. H., & Phaner, M. "Scanning tunneling microscopy observation of local damages induced on graphite surface by ion implantation." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 9.2 (1991): 1064-1067.

Uwagi

Opracowanie rekordu ze środków MNiSW, umowa nr POPUL/SP/0154/2024/02 w ramach programu "Społeczna odpowiedzialność nauki II" - moduł: Popularyzacja nauki i promocja sportu (2025).