Modelling and the inverse problem in spectrally resolved thermoluminescence

• Autorzy: Mandowski A. , Mandowska E. , Świątek J.
• Konferencja: IX th International Seminar on Physics and Chemistry of Solids, ISPCS ‘03
• Języki publikacji: EN

Abstrakty

EN

Typical analysis of thermoluminescence (TL) is based on various curve fitting algorithms. Older methods used merely several characteristic points of TL curves as the peak position, inflection points or peak width. This approach is generally not suitable for advanced TL measurements utilizing simultaneous detection of wavelength and intensity of the emitted light. In this paper we present some numerical methods for modelling (simulation) of spectrally resolved thermoluminescence as well as determination of parameters of traps and recombination centres from measured data. The latter case is more complex. For this purpose we put forward a new technique called surface fitting. Exemplary data for selected materials are presented.

Słowa kluczowe

EN

thermoluminescence; numerical methods for modelling; surface fitting

PL

termoluminescencja; numeryczne metody modelowania; dopasowanie powierzchniowe

• Wydawca: Wydawnictwo Wyższej Szkoły Pedagogicznej w Częstochowie
• Czasopismo: Prace Naukowe. Chemia / Wyższa Szkoła Pedagogiczna w Częstochowie
• Rocznik: 2003
• Tom: Vol. 8
• Strony: 37--44
• Opis fizyczny: Bibliogr. 11 poz., rys.

Twórcy

autor

Mandowski A.

• Institute of Physics, Pedagogical University, ul. Armii Krajowej 13/15, 42-200 Częstochowa, Poland

autor

Mandowska E.

• Institute of Physics, Pedagogical University, ul. Armii Krajowej 13/15, 42-200 Częstochowa, Poland

autor

Świątek J.

• Institute of Physics, Pedagogical University, ul. Armii Krajowej 13/15, 42-200 Częstochowa, Poland

Bibliografia

• [1] S. W. S. McKeever, Thermoluminescence of Solids, Cambridge University Press, Cambridge, 1985.
• [2] R. Chen, S. W, S. McKeever, Theory of Thermoluminescence and Related Phenomena, Singapore: World Scientific, 1997.
• [3] B. J. Luff, P. D. Townsend, Meas. Sci. Technol. 3, pp. 65-71,1992.
• [4] T. M. Piters, M. Muelemans, A. J. J. Bos, Rev. Sci. Instrum. 69(1), pp. 109-117, 1993.
• [5] A. Mandowski, E. Mandowska, P. Czub, W. Mazela, J. Świątek, J. Pielichowski, SPIE proc. 2003 (in press).
• [6] E. Mandowska, P. Bilski, E. Ochab, J. Świątek, and A. Mandowski, Rad. Prot. Dosimetry 100, pp. 451-454, 2002.
• [7] A. Opanowicz, K. Przybyszewski, Proc. of SPIE, 2373, 236-240, (1995).
• [8] A. Mandowski, J. Świątek, Radiat. Prot. Dosimetry. 65, 55-58, 1996.
• [9] A. Mandowski, J. Świątek, Radiat. Prot. Dosimetry, 84, 123-126, 1999.
• [10] C. M. Sunta, W. E. Ferya Ayta, J.F.D. Chubaci and S. Watanabe, Radiat. Prot. Dosimetry, 84, 51-54, 1999.
• [11] A. Mandowski, Rad. Prot. Dosimetry 100, pp. 115-118, 2002.