Critical review of present-day methodology of thermal imager noise characterization

• Autorzy: Chrzanowski Krzysztof

Identyfikatory

DOI

10.24425/mms.2025.154668

• Języki publikacji: EN

Abstrakty

EN

This paper presents a review of reasons that create metrological chaos in the field of characterization of noise in thermal imagers. In detail, the paper presents a critical review of myriads of past and present-day definitions/measurement methods of noise parameters of thermal imagers that create this chaos and significantly reduce reproducibility of measurement of noise parameters carried out by different test teams.

Słowa kluczowe

EN

thermal imager; noise; 3D noise; NETD

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2025
• Tom: Vol. 32, nr 2
• Strony: 1--21
• Opis fizyczny: Bibliogr. 36 poz., rys., tab., wykr., wzory

Twórcy

autor

Chrzanowski Krzysztof

• Military University of Technology, Institute of Optoelectronics, 2 Kaliskiego Str., 00-908 Warsaw, Poland
• INFRAMET, Bugaj 29a, Koczargi Nowe, 05-082 Stare Babice, Poland

• https://orcid.org/0000-0001-6533-2151

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