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Tytuł artykułu

Surface forces in chemical mechanical planarization and semiconductor wafer cleaning systems

Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Superior uniformity and local planarity of semiconductor wafers in the chemical mechanical planarization (CMP) process as well as efficient post-CMP cleaning is controlled by surface chemistry phenomena. The AFM colloidal probe technique was used to demonstrate surface forces which are of special significance to CMP and post-CMP cleaning. Examples of ways to manipulate those interactions are provided, and the benefits to CMP processes and post-CMP cleaning are discussed.
Rocznik
Strony
1229--1240
Opis fizyczny
Bibliogr. 23 poz., rys., wykr.
Twórcy
Bibliografia
  • [1] M. Krishnan, J. Nalaskowski, and L. Cook, Chem. Rev., 2009, 110, 178.
  • [2] P.B. Zantye, A. Kumar, A.K. Sikder, Mater. Sci. Eng. R Rep., 2004, 45, 89.
  • [3] J.N. Israelachvili, Intermolecular and surface forces, Academic Press, London, 1992.
  • [4] M.R. Uhlig, S. Benaglia, R. Thakkar, J. Comer, R. Garcia, Nanoscale, 2021, 13, 5275.
  • [5] L. Hupka, Particle-Surface Interactions in Post-Lap Cleaning of Alumina/Titanium Carbide Wafers, University of Utah, Salt Lake City, 2006.
  • [6] J. Nalaskowski, J. Drelich, J. Hupka, J.D. Miller, Langmuir, 2003, 19, 5311.
  • [7] B. Babel, M. Rudolph, MethodsX, 2019, 6, 651.
  • [8] L. Hupka, J. Nalaskowski, N. Sinha, J. Greeley, Z. Clark, H. Du, W. Johnson, J. Miller, Solid State Phenomena, 2009, 145, 77.
  • [9] J. Nalaskowski, 13th International Symposium on Chemical-Mechanical Planarization, CAMP Clarkson University, New York, 2010.
  • [10] Q. Xu, L. Chen, J. Liu, H. Cao, ECS J. Solid State Sci. Technol., 2019, 8, 370.
  • [11] Q. Xu, L. Chen, H. Cao, J. Liu, ECS J. Solid State Sci. Technol, 2021, 10, 1149.
  • [12] Y. Li, Y. Liu, C. Wang, X. Niu, T. Ma, and Y. Xu, ECS J. Solid State Sci. Technol., 2018, 7, 317.
  • [13] B. Wu, ECS J. Solid State Sci. Technol, 2021, 10, 3.
  • [14] Q. Xu, F. Yang, L. Chen, H. Cao, Int. J. of Prec. Eng. and Mfg., 2018, 19, 1585.
  • [15] C. Yang, X. Niu, J. Zhou, J. Wang, Z. Huo, Y. Lu, ECS J. Solid State Sci. Technol., 2020, 9, 534.
  • [16] C. Wang, Y. Liu, C. Wang, H. Zhang, China Semiconductor Technology International Conference (CSTIC), 2019.
  • [17] S. Tian, B. Tan, Q. Wang, C. Han, L. Yang, B. Gao, China Semiconductor Technology International Conference (CSTIC), 2019.
  • [18] Q. Wang Colloids Surf.-Physicochem. Eng. Asp., 2020, 2, 586.
  • [19] S. Assemi, J. Nalaskowski, J.D. Miller, W.P. Johnson, Langmuir, 2006, 22, 1403.
  • [20] J. Nalaskowski, 10th International Symposium on Wafer Cleaning and Surface Preparation, Boise, ID, 2006.
  • [21] Nalaskowski J., Hupka L., Miller J.D., 9th International Symposium “Surface Preparation to the Forefront: Advanced Materials and Technologies for 65nm and Below,” Boise, ID, Jun. 2005.
  • [22] J. Hupka, A. Tonderski, R. Aranowski, C. Jungnickel, Oils and Fuels for Sustainable Development, Gdansk, 2008.
  • [23] L. Hupka, Particle-wafer interactions in semiaqueous silicon cleaning systems, University of Utah, Salt Lake City, 2008.
Uwagi
Opracowanie rekordu ze środków MNiSW, umowa Nr 461252 w ramach programu "Społeczna odpowiedzialność nauki" - moduł: Popularyzacja nauki i promocja sportu (2021).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-9ac96ba7-a597-40e3-8e7f-34d7b35a59c0
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