Noise Properties of Graphene-Polymer Thick-Film Resistors

• Autorzy: Mleczko K. , Ptak P. , Zawiślak Z. , Słoma M. , Jakubowska M. , Kolek A.

Identyfikatory

DOI

10.1515/mms-2017-0051

• Języki publikacji: EN

Abstrakty

EN

Graphene is a very promising material for potential applications in many fields. Since manufacturing technologies of graphene are still at the developing stage, low-frequency noise measurements as a tool for evaluating their quality is proposed. In this work, noise properties of polymer thick-film resistors with graphene nano-platelets as a functional phase are reported. The measurements were carried out in room temperature. 1/f noise caused by resistance fluctuations has been found to be the main component in the specimens. The parameter values describing noise intensity of the polymer thick-film specimens have been calculated and compared with the values obtained for other thick-film resistors and layers used in microelectronics. The studied polymer thick-film specimens exhibit rather poor noise properties, especially for the layers with a low content of the functional phase.

Słowa kluczowe

EN

graphene; polymer thick-film resistor; low-frequency noise; noise measurements

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2017
• Tom: Vol. 24, nr 4
• Strony: 589--594
• Opis fizyczny: Bibliogr. 17 poz., rys., tab., wykr.

Twórcy

autor

Mleczko K.

• Rzeszów University of Technology, Faculty of Electrical and Computer Engineering, W. Pola 2, 35-959 Rzeszów, Poland

autor

Ptak P.

• Rzeszów University of Technology, Faculty of Electrical and Computer Engineering, W. Pola 2, 35-959 Rzeszów, Poland

autor

Zawiślak Z.

• Rzeszów University of Technology, Faculty of Electrical and Computer Engineering, W. Pola 2, 35-959 Rzeszów, Poland

autor

Słoma M.

• Warsaw University of Technology, Faculty of Mechatronics, Św. A. Boboli 8, 02-525 Warsaw, Poland

autor

Jakubowska M.

• Warsaw University of Technology, Faculty of Mechatronics, Św. A. Boboli 8, 02-525 Warsaw, Poland

autor

Kolek A.

• Rzeszów University of Technology, Faculty of Electrical and Computer Engineering, W. Pola 2, 35-959 Rzeszów, Poland

Bibliografia

• [1] Sensale-Rodriguez, B. (2015). Graphene-Based Optoelectronics. J. Lightw. Technol., 33(5), 1100-1108.
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• [3] Li, C., Gao, X., Guo, T., Xiao, J., Fan, S., Jin, W. (2015). Analyzing the applicability of miniature ultra-high sensitivity Fabry-Perot acoustic sensor using a nanothick graphene diaphragm. Meas. Sci. Technol., 26(8), 085101.
• [4] Smith, A.D., Vaziri, et al. (2013). Pressure sensors based on suspended graphene membranes. Solid-State Electron., 88, 89-94.
• [5] Zhang, Y., Han, H., et al. (2015). Improved heat spreading performance of functionalized graphene in microelectronic device application. Adv. Funct. Mater., 25(28), 4430-4435.
• [6] Lostetter, A.B., Barlow, F., Elshabini, A., Olejniczak, K., Ang, S. (2000). Polymer thick film (PTF) and flex technologies for low cost power electronics packaging. International Workshop on Integrated Power Packaging, IWIPP 2000, 33-40.
• [7] Słoma, M., Jakubowska, M., et al. (2011). Investigations on printed elastic resistors containing carbon nanotubes. J. Mater. Sci. Mater. Electron., 22(9), 1321-1329.
• [8] Dziedzic, A., Kolek, A. (1998). 1/f noise in polymer thick-film resistors. J. Phys. D: Appl. Phys., 31, 2091-2097.
• [9] Dziedzic, A. (2007). Carbon/polyesterimide thick-film resistive composites-experimental characterization and theoretical analysis of physicochemical, electrical and stability properties. Microelectron. Rel., 47(2), 354-362.
• [10] Srinivasa Rao, Y. (2007). Studies on electrical properties of polymer thick film resistors. Microelectron. Int., 24(1), 8-14.
• [11] Voss, R.F., Clarke, J. (1976). 1/f Noise from Systems in Thermal Equilibrium. Phys. Rev. Lett., 36(1), 42-45.
• [12] Hooge, F.N. (1976). 1/f noise. Physica B, 83, 14-23.
• [13] Vandamme, L.K.J., Casier, H.J. (2004). The 1/f noise versus sheet resistance in poly-Si is similar to poly-SiGe resistors and Au-layers. Proc. 34th European Solid-State Device Research Conf. 2004, Leuven, Belgium. 365-368.
• [14] Stadler, A.W., Kolek, A., et al. (2010). Noise properties of Pb/Cd-free thick film resistors. J. Phys. D: Appl. Phys., 43(26), 265401.
• [15] Stadler, A.W. (2011). Noise properties of thick-film resistors in extended temperature range. Microelectron. Rel. 51, 1264-1270.
• [16] Fu, S.L., Liang, M.S., Shiramatsu, T., Wu, T.S. (1981). Electrical Characteristics of Polymer Thick Film Resistors, Part I: Experiemental Results. IEEE Trans. on Components, Hybrids, and Manuf. Technol., 4(3), 283-288.
• [17] Mleczko, K., Zawiślak, Z., Stadler, A.W., Kolek, A., Dziedzic, A., Cichosz, J. (2008). Evaluation of conductive-to-resistive layers interaction in thick-film resistors. Microelectron. Rel. 48, 881-885.

Uwagi

EN

This work was supported by the Rzeszow University of Technology, Department of Electronic Fundamentals Grant for Statutory Activity and statutory founding of IMiIB Warsaw University of Technology. The authors acknowledge the great contribution to the paper from late Prof. A. W. Stadler.

PL

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).